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MOSFET
Results: 875

#	Item
481	NNIN Seminar on Electron devices for VLSI computation and RF/mm-wave communication, Santa Barbara Feb. 6-7, 2012 nm Transistor Scaling for VLSI and THz Applications Mark Rodwell University of California, Santa Barbara Add to Reading List Source URL: www.nanotech.ucsb.edu Language: English - Date: 2013-01-06 22:14:18 Transistor Capacitor Technology Bipolar junction transistor MOSFET
482	IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 22, NO. 10, OCTOBER[removed]A Compact Transregional Model for Digital CMOS Circuits Operating Near Threshold Add to Reading List Source URL: www.async.caltech.edu Language: English - Date: 2014-09-24 17:59:20 Electromagnetism Electronic design Logic families MOSFET Drain Induced Barrier Lowering Threshold voltage Field-effect transistor CMOS IC power supply pin Electronic engineering Electrical engineering Integrated circuits
483	High-‐frequency poten2al for Future Silicon CMOS and BiCMOS technologies Jack Pekarik STSM, IBM SiGe Technology Development Chair, RFAMS Wo Add to Reading List Source URL: www.nanotech.ucsb.edu Language: English - Date: 2013-01-06 22:14:17 Logic families Digital electronics Electronic design BiCMOS MOSFET Silicon-germanium CMOS 65 nanometer 90 nanometer Electronic engineering Electronics Integrated circuits
484	Microsoft Word - TJKLiu.resume.aug2014 Add to Reading List Source URL: www.eecs.berkeley.edu Language: English - Date: 2014-09-16 01:17:34 Semiconductors Semiconductor devices Integrated circuits Microtechnology MOSFET Transistor CMOS International Electron Devices Meeting Chenming Hu Technology Electronic engineering Electromagnetism
485	Data remanence in non-volatile semiconductor memory (Part I) Security Group Sergei Skorobogatov Add to Reading List Source URL: www.cl.cam.ac.uk Language: English - Date: 2004-11-03 05:46:18 Computing Electronics EPROM Flash memory Floating Gate MOSFET Microcontroller PIC microcontroller Data remanence Reading Computer memory Computer hardware Non-volatile memory
486	Reliable Minimum Energy CMOS Circuit Design Sean Keller∗ , Siddharth S. Bhargav† , Chris Moore∗ Alain J. Martin∗ ∗ Department of Computer Science California Institute of Technology Add to Reading List Source URL: www.async.caltech.edu Language: English - Date: 2011-06-10 19:18:58 Integrated circuits Electronic design Digital electronics Logic families Logic gates Dynamic voltage scaling Low-power electronics MOSFET Inverter Electronic engineering Electronics Electromagnetism
487	Data Remanence in Flash Memory Devices Sergei Skorobogatov University of Cambridge, Computer Laboratory, 15 JJ Thomson Avenue, Cambridge CB3 0FD, United Kingdom [removed] Add to Reading List Source URL: www.cl.cam.ac.uk Language: English - Date: 2005-08-09 07:34:54 Computing Electronics EPROM Flash memory Non-volatile random-access memory Floating Gate MOSFET Microcontroller Hot carrier injection Dynamic random-access memory Computer memory Computer hardware Non-volatile memory
488	TCAD Services, Stress Engineering datasheet Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 14:36:12 Electronic design automation Hillsboro Oregon Synopsys Simulation MOSFET Strain engineering Stress Semiconductor process simulation Technology CAD Physics Mechanics Electronic engineering
489	Microsoft PowerPoint - NNINsymposium.feb12 [Compatibility Mode] Add to Reading List Source URL: www.nanotech.ucsb.edu Language: English - Date: 2013-01-06 22:14:17 Electronics MOSFET CMOS Field-effect transistor Multiple patterning Dynamic voltage scaling International Electron Devices Meeting Electronic engineering Logic families Technology
490	Selected Novel Technologies for Licensing 2012 MRS Fall Add to Reading List Source URL: www.jst.go.jp Language: English - Date: 2013-11-29 00:56:28 Power electronics Nitrides MOSFET Field-effect transistor Gallium nitride Transistor Gate oxide Threshold voltage Insulated gate bipolar transistor Chemistry Electrical engineering Semiconductor devices

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