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Hot carrier injection
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1	Application Note \| AN111 ProChek Hot Carrier Injection (HCI) Measurements for the ON Semiconductor ONC18 Process Introduction Today’s microelectronic circuits are designed for high performance and long life in a wide r Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Electrical engineering Electromagnetism Electronic engineering Integrated circuits Semiconductor devices Logic families CMOS Electronic design Hot-carrier injection MOSFET Negative-bias temperature instability Threshold voltage
2	PROCHEK PRODUCT BRIEF E N G I N E E R I N G I N N O V A T I O N Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Integrated circuits Semiconductor device fabrication Semiconductor devices Electronic design Semiconductors Integrated circuit design Integrated circuit Reliability Coupon Hot-carrier injection Silicon-germanium Electromigration
3	Microsoft Word - PR-NBTI_June7 Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Electronic engineering Semiconductor devices Negative-bias temperature instability Semiconductor device fabrication Hot-carrier injection Semiconductor intellectual property core Transistor
4	Microsoft Word - Prognostic Techniques for Deep Submicron Semiconductors[1]. Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Survival analysis Failure Semiconductors Maintenance Semiconductor device fabrication Hot-carrier injection Reliability Electromigration MOSFET Prognostics Integrated circuit Failure rate
5	E LECTRON DEVICES S OCIETY IEEE ELECTRON DEVICES SOCIETY JanVol. 11, No. 1 Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:14 Electromagnetism IEEE Electron Devices Society Institute of Electrical and Electronics Engineers IEEE Transactions on Semiconductor Manufacturing International Electron Devices Meeting Chenming Hu Ilesanmi Adesida Hot carrier injection Reliability engineering Semiconductors Engineering Electronic engineering
6	Microsoft Word - IRPS 2016 CFP Add to Reading List Source URL: www.irps.org Language: English - Date: 2015-03-20 12:31:19 Electronics Integrated circuits Electronic design Failure Semiconductor device fabrication Reliability Hot carrier injection Soft error Transistor Electronic engineering Semiconductors Technology
7	E LECTRON DEVICES S OCIETY IEEE ELECTRON DEVICES SOCIETY OctVol. 10, No. 4 Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:18 Electromagnetism IEEE Electron Devices Society International Electron Devices Meeting Institute of Electrical and Electronics Engineers Integrated circuit Laser diode Reliability engineering Hot carrier injection Symposium on VLSI Circuits Semiconductors Electronic engineering Engineering
8	JULY 2010 VOL. 17, NO. 3 ISSN: TABLE OF Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:31 Engineering Electromagnetism Professional associations Standards organizations IEEE Electron Devices Society IEEE Technical Activities Board Institute of Electrical and Electronics Engineers Hot carrier injection International Electron Devices Meeting Electronic engineering International nongovernmental organizations Semiconductors
9	Microsoft WordEDS Meetings Calendar April 2014 Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2014-04-08 10:49:29 Integrated circuits Electromagnetism Symposium on VLSI Circuits International Electron Devices Meeting IEEE Electron Devices Society Very-large-scale integration ISPSD Hot carrier injection Institute of Electrical and Electronics Engineers Electronic engineering Semiconductors Electronics
10	July 2014 Vol. 21, No. 3 ISSN: Table of Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2014-07-15 10:49:27 Semiconductors Integrated circuits Semiconductor devices Logic families Power electronics MOSFET IEEE Electron Devices Society Hot carrier injection International Electron Devices Meeting Electronic engineering Electronics Electromagnetism

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