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Negative-bias temperature instability
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1	Application Note \| AN111 ProChek Hot Carrier Injection (HCI) Measurements for the ON Semiconductor ONC18 Process Introduction Today’s microelectronic circuits are designed for high performance and long life in a wide r Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Electrical engineering Electromagnetism Electronic engineering Integrated circuits Semiconductor devices Logic families CMOS Electronic design Hot-carrier injection MOSFET Negative-bias temperature instability Threshold voltage
2	RGNBTI PRODUCT BRIEF E N G I N E E R I N G I N N O V A T I O N Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Electronic engineering Negative-bias temperature instability Semiconductor device fabrication Digital electronics Integrated circuits Electronic design Prognostics Threshold voltage Battery MOSFET Field-effect transistor CMOS
3	Microsoft Word - PR-NBTI_June7 Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Electronic engineering Semiconductor devices Negative-bias temperature instability Semiconductor device fabrication Hot-carrier injection Semiconductor intellectual property core Transistor
4	Copyright © 2012 American Scientiﬁc Publishers All rights reserved Printed in the United States of America Journal of Low Power Electronics Add to Reading List Source URL: euler.ecs.umass.edu Language: English - Date: 2012-11-06 11:44:32 Electronic engineering Electromagnetism Electronics Integrated circuits Electronic design automation Electronic design Semiconductor device fabrication Hardware Trojan Automatic test pattern generation Electromigration Reliability engineering Negative-bias temperature instability
5	SISPAD 2012, September 5-7, 2012, Denver, CO, USA Development of Predictive Model and Circuit Simulation Methodology for Negative Bias Temperature Instability Effects C. Ma, H. J. Mattausch, M. Miyake, Add to Reading List Source URL: in4.iue.tuwien.ac.at Language: English - Date: 2013-02-12 08:39:15
6	PDF Document Add to Reading List Source URL: mesl.ucsd.edu Language: English - Date: 2014-02-11 01:14:56 Computing Computer architecture GPGPU Parallel computing Computer engineering Graphics hardware Application programming interfaces Cross-platform software Negative-bias temperature instability Compute kernel General-purpose computing on graphics processing units OpenCL
7	Photon Factory Activity Report 2005 #23Part BSurface and Interface 4C,6A,15C/2004G059 Residual Order in the Interfacial SiO2 Layer Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:32:23 Electronic engineering Transistors High-k dielectric Gate dielectric Thermal oxidation Semiconductor device fabrication Silicon dioxide Polycrystalline silicon Negative bias temperature instability Chemistry Electromagnetism Electronics
8	Design of a video interface controller for color sequential liquid-cystal-on-silicon mincrodisplay Add to Reading List Source URL: www.pskl.ust.hk Language: English - Date: 2014-10-10 03:11:48 Electronic engineering Condensed matter physics Display technology Negative bias temperature instability Semiconductor devices Thin-film transistor Reliability Transistor Active matrix Technology Semiconductor device fabrication Semiconductors
9	506 IEEE ELECTRON DEVICE LETTERS, VOL. 32, NO. 4, APRIL 2011 A New Observation of the Elliot Curve Waveform in Charge Pumping of Poly-Si TFTs Add to Reading List Source URL: www.pskl.ust.hk Language: English - Date: 2014-10-10 02:44:39 Electromagnetism Semiconductor devices MOSFET Electronic engineering Negative bias temperature instability Hot carrier injection Transistor Thin-film transistor VLAN Trunking Protocol Technology Semiconductors Condensed matter physics
10	P-6: Static Reliability of Bridged-Grain Poly-Si TFTs Add to Reading List Source URL: www.pskl.ust.hk Language: English - Date: 2014-10-10 03:11:49 Semiconductors Molecular electronics Organic electronics Display technology Semiconductor device fabrication Thin-film transistor Negative bias temperature instability Hot carrier injection AMOLED Electronics Electromagnetism Technology

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