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Electromigration
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1	Rapid reversible electromigration of intercalated K ions within individual MoO3 nanobundle Zhibin Hu, Chenggang Zhou, Rajiv Ramanujam Prabhakar, Sharon Xiaodai Lim, Yinghui Wang et al. Citation: J. Appl. Phys. 113, 02431 Add to Reading List Source URL: www.ciba.nus.edu.sg Language: English - Date: 2014-11-06 23:11:15
2	Subscriber access provided by - Access paid by the \| UC Irvine Libraries Letter Reconnectable Sub-5 nm Nanogaps in Ultralong Gold Nanowires Chengxiang Xiang, Jung Yun Kim, and Reginald M. Penner Add to Reading List Source URL: cfse.ps.uci.edu Language: English - Date: 2011-11-02 16:52:47 Nanoelectronics Electronics Mesoscopic physics Electromagnetism Nanowire Electrical engineering Electromigration Threshold voltage Magnetic reconnection
3	Microsoft Word - In-situ Sensors[1].doc Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:10 Electronic engineering Electromagnetism Engineering Survival analysis Electronics manufacturing Electronic design automation Failure Maintenance Prognostics Electromigration Reliability JTAG
4	Ridgetop Group, IncWest Ina Road Tucson, AZPhone: +Fax: +www.RidgetopGroup.com Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Electronic engineering Electromagnetism Semiconductor devices Electrical engineering Coupon Electromigration Reliability Dialog Semiconductor Integrated circuit Semiconductor device fabrication
5	PROCHEK PRODUCT BRIEF E N G I N E E R I N G I N N O V A T I O N Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Integrated circuits Semiconductor device fabrication Semiconductor devices Electronic design Semiconductors Integrated circuit design Integrated circuit Reliability Coupon Hot-carrier injection Silicon-germanium Electromigration
6	Microsoft Word - Prognostic Techniques for Deep Submicron Semiconductors[1]. Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Survival analysis Failure Semiconductors Maintenance Semiconductor device fabrication Hot-carrier injection Reliability Electromigration MOSFET Prognostics Integrated circuit Failure rate
7	Rapid Characterization Method for New Semiconductor Processes Esko Mikkola, Ph.D., & Andrew Levy Ridgetop Group IncWest Ina Road Tucson, AZUSA Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Semiconductor device fabrication Electronic engineering Design for X Electronic design automation Coupon Reliability Integrated circuit design Fabless manufacturing Device under test Electromigration
8	Olzat Toktarbaiuly Electromigration of atoms on vicinal surfaces at high temperatures Step bunching of vicinal Si(111), W(110) and Al2O3are discussed and an experimental setup built to anneal the samples in a cont Add to Reading List Source URL: www.tcd.ie Language: English - Date: 2016-01-20 08:36:56
9	SISPAD 2012, September 5-7, 2012, Denver, CO, USA Modeling of Electromigration Induced Resistance Change in Three-Dimensional Interconnects with Through Silicon Vias R. L. de Orio∗ , H. Ceric∗† , and S. Selberherr Add to Reading List Source URL: in4.iue.tuwien.ac.at Language: English - Date: 2013-02-12 08:39:07
10	SISPAD 2012, September 5-7, 2012, Denver, CO, USA TCAD Study of Electromigration Failure Modes in Sn-Based Solder Bumps H. Cerica,b, R. L. de Oriob, and S. Selberherrb a Add to Reading List Source URL: in4.iue.tuwien.ac.at Language: English - Date: 2013-02-12 08:39:10

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