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Automatic test pattern generation
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1	Datasheet SpyGlass DFT ADV RTL Testability Analysis and Improvement Overview Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2016-07-28 07:15:29 Electronic engineering Electronic design automation Electronics Electronic design Integrated circuits Automatic test pattern generation Fault coverage SystemVerilog Timing closure Design for testing
2	Proceedings of the International MultiConference of Engineers and Computer Scientists 2012 Vol II, IMECS 2012, March, 2012, Hong Kong A Self-checking CMOS Full adder in Double Pass Transistor Logic Chiraz Khedhir Add to Reading List Source URL: www.bpti.lt Language: English - Date: 2013-12-16 08:28:44 Electronic engineering Logic families Electronics Electromagnetism Electronic design Semiconductor devices Digital electronics Integrated circuits Pass transistor logic Adder CMOS Automatic test pattern generation
3	Low Power MSIC Signatures for Effective BIST Design Chekka Narasimha Rao M.Tech Student, Audi Sankara Institute of Technology, NH-5 Bypass Road, East Gudur Rural, Andrapradesh Add to Reading List Source URL: www.ijmetmr.com Language: English - Date: 2015-01-10 06:34:49 Integrated circuits Automatic test pattern generation Linear-feedback shift register Built-in self-test Scan chain Hardware Trojan
4	1 Position: Design Engineer Location: Hong Kong Job Responsibilities: Add to Reading List Source URL: www.solomon-systech.com Language: English - Date: 2016-05-27 06:19:26
5	Copyright © 2012 American Scientiﬁc Publishers All rights reserved Printed in the United States of America Journal of Low Power Electronics Add to Reading List Source URL: euler.ecs.umass.edu Language: English - Date: 2012-11-06 11:44:32 Electronic engineering Electromagnetism Electronics Integrated circuits Electronic design automation Electronic design Semiconductor device fabrication Hardware Trojan Automatic test pattern generation Electromigration Reliability engineering Negative-bias temperature instability
6	Microsoft Word - Artificial Evolution in Computer Aided Design Add to Reading List Source URL: www.genetic-programming.org Language: English - Date: 2012-06-28 00:31:21 Computer architecture Evolutionary algorithms Mathematical optimization Cybernetics Genetic algorithms Evolutionary computation Intel Core Automatic test pattern generation Genetic programming Computer hardware Electronic engineering Central processing unit
7	Information at FredCohen.nethttp://FredCohen.net/ Add to Reading List Source URL: all.net Language: English - Date: 2013-07-10 14:08:02 Software testing Automatic test pattern generation
8	Datasheet High Quality, Low Cost Test Overview DFTMAX™ is a comprehensive Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2015-03-20 14:15:36 Electronics manufacturing Electronic design Integrated circuits Automatic test pattern generation Test compression Scan chain Boundary scan Joint Test Action Group Physical design Electronic engineering Electronics Electronic design automation
9	onTAP Interconnect Test Product Description Interconnect Test Interconnect tests are a key function of any boundary scan test program. The onTAPInterconnect Test performs the 3 essential functions of boundary scan: 1. C Add to Reading List Source URL: www.flynn.com Language: English - Date: 2015-03-10 14:16:18 Electronic engineering Boundary scan Joint Test Action Group Serial Vector Format Resistor Automatic test pattern generation Boundary scan description language Electronics manufacturing Manufacturing Electronics
10	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2011-06-14 10:41:40 Electronic engineering Joint Test Action Group Boundary scan Serial Vector Format Field-programmable gate array Automatic test pattern generation Berkeley Software Distribution Boundary scan description language Electronics manufacturing Manufacturing Electronics