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Fault coverage
Results: 48

#	Item
1	Coverage-based Trace Signal Selection for Fault Localisation in Post-Silicon Validation Charlie Shucheng Zhu1? , Georg Weissenbacher2?? , and Sharad Malik1 1 2 Add to Reading List Source URL: www.georg.weissenbacher.science Language: English - Date: 2013-01-16 06:44:48
2	Datasheet SpyGlass DFT ADV RTL Testability Analysis and Improvement Overview Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2016-07-28 07:15:29 Electronic engineering Electronic design automation Electronics Electronic design Integrated circuits Automatic test pattern generation Fault coverage SystemVerilog Timing closure Design for testing
3	BOULDER MEDICAL CENTER, P.C. Colorado is an “At Fault” state. How does billing work with Motor Vehicle Accident? Option 1: Auto Insurance Coverage   Add to Reading List Source URL: www.bouldermedicalcenter.com Language: English - Date: 2015-02-10 06:21:55
4	Fault-Tolerant Multi-Robot Area Coverage with Limited Visibility Pooyan Fazli, Alireza Davoodi, Philippe Pasquier, and Alan K. Mackworth Abstract— We address the problem of multi-robot area coverage and present a new a Add to Reading List Source URL: www.frc.ri.cmu.edu Language: English - Date: 2010-04-09 12:19:38
5	Coverage-based Trace Signal Selection for Fault Localisation in Post-Silicon Validation Charlie Shucheng Zhu1? , Georg Weissenbacher2?? , and Sharad Malik1 1 2 Add to Reading List Source URL: www.georg.weissenbacher.name Language: English - Date: 2013-01-16 06:44:48
6	Testwell CTC++: Code Coverage Analysis for safety-critical Embedded Systems by Professor Dr. Daniel Fischer (University of Applied Sciences Offenburg, Germany) Software for embedded systems is often used in safety-critic Add to Reading List Source URL: www.verifysoft.com Language: English - Date: 2013-09-27 11:06:04 Software Testwell CTC++ Code coverage Embedded system Fault coverage Coverage C Tcov Avionics software Software engineering Software testing Electronics
7	IKOR Group www.xjtag.com HOME APPLIANCES AUTOMOTIVE Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2010-04-08 06:42:01 Electronics Boundary scan In-circuit test Design for testing Joint Test Action Group Test engineer Scan chain Fault coverage Test Electronics manufacturing Electronic engineering Manufacturing
8	Datasheet DFTMAX Ultra Compression for Highest Test Quality and Lowest Test Cost Overview Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 14:32:25 Integrated circuits Electronic design Software testing Automatic test pattern generation Scan chain Code coverage Automatic test equipment Fault coverage Electronic engineering Electronics Electronic design automation
9	onTAP Manufacturing Product Description Manufacturing Highlights: Manufacturing w/ProScan Add to Reading List Source URL: www.flynn.com Language: English - Date: 2015-03-10 14:16:21 Electromagnetism Electronics manufacturing Electronic design automation Joint Test Action Group OnTap Application-specific integrated circuit Fault coverage Electronic engineering Electronics Integrated circuits
10	Test Case Purification for Improving Fault Localization Jifeng Xuan, Martin Monperrus To cite this version: Jifeng Xuan, Martin Monperrus. Test Case Purification for Improving Fault Localization. FSE - 22nd ACM SIGSOFT I Add to Reading List Source URL: hal.inria.fr Language: English - Date: 2015-01-20 21:53:37 Debugging Software development Extreme programming Program analysis Program slicing Software maintenance Unit testing Fault coverage Assertion Software testing Software engineering Computer programming