Acoustic microscopy - PDFSEARCH.IO - Document Search Engine

Acoustic microscopy
Results: 42

#	Item
1	Development of a Resolution Test Wafer for Use in Acoustic Microscopy of Microelectronic Devices Janet E. Semmens1, Rupert Fischer2, and Lawrence W. Kessler1 1 Sonoscan, IncE. Pratt Blvd. Add to Reading List Source URL: www.sonoscan.com - Date: 2016-07-20 11:09:32
2	High-Frequency Acoustic Microscopy Studies of Buried Interfaces in Silicon Add to Reading List Source URL: www.sonoscan.com - Date: 2016-07-20 11:09:32
3	Technology Opportunity, Ref. No. UAA novel algorithm for phase computation in atomic force microscopy A novel algorithm has been developed which provides highly accurate phase measurements. In particular, the al Add to Reading List Source URL: www.switt.ch Language: English - Date: 2015-10-13 03:40:46 Scanning probe microscopy Intermolecular forces Chemistry Electronic engineering Learning Atomic-force microscopy Microscopy Phase-locked loop Non-contact atomic force microscopy Atomic force acoustic microscopy
4	CHARACTERIZATION OF FLIP CHIP BUMP FAILURE MODES USING HIGH FREQUENCY ACOUSTIC MICRO IMAGING Janet E. Semmens and Lawrence W. Kessler SONOSCAN, INC. 530 East Green Street Bensenville, ILU.S.A. Add to Reading List Source URL: www.sonoscan.com Language: English - Date: 2016-07-20 11:09:32 Microscopy Electronics manufacturing Manufacturing Economy Business Acoustic microscopy Flip chip Solder Reliability Integrated circuit Bump Microscope
5	US008720273B2United States Patent Kessler et a1. (54) Add to Reading List Source URL: www.sonoscan.com Language: English - Date: 2016-07-11 10:56:20 Microscopy Microbiology Science and technology Economy Nondestructive testing Acoustics Acoustic microscopy Microscope Ultrasonic testing Scanning acoustic microscope Electromagnetic acoustic transducer
6	Evaluation of Silicon on Insulator (SOI) Bonded Wafers Using Automated Acoustic Micro Imaging Janet E. Semmens and Bryan P. Schackmuth Sonoscan, IncE. Pratt Boulevard Elk Grove Village, ILUSA Add to Reading List Source URL: www.sonoscan.com Language: English - Date: 2016-07-20 11:09:32 Semiconductor device fabrication Materials science Technology Electronic engineering Wafer Silicon on insulator Acoustic microscopy Integrated circuit Three-dimensional integrated circuit Soitec Smart cut
7	P PAUMANOK PUBLICATIONS JANUARY/FEBRUARY 2007 Add to Reading List Source URL: www.sonoscan.com Language: English - Date: 2016-07-20 11:09:32 Capacitors Electromagnetism Energy Electrical engineering Acoustic microscopy Electronic component Surface-mount technology Electrolytic capacitor Film capacitor
8	J610™ Product Specification J610 ™ Add to Reading List Source URL: www.sonoscan.com Language: English - Date: 2016-07-11 10:56:20 Microscopy Medical physics Acoustic microscopy Medicine Scan Single-photon emission computed tomography Measurement Optics Medical imaging
9	EVALUATION OF UNDERFILL IN FLIP CHIP AND BGA ON PC BOARDS USING 3V RECONSTRUCTION AND THROUGHTRANSMISSION IMAGING Janet E. Semmens Sonoscan, IncE. Pratt Boulevard Elk Grove Village, ILUSA Add to Reading List Source URL: www.sonoscan.com Language: English - Date: 2016-07-20 11:09:32 Electronic engineering Electromagnetism Electrical engineering Acoustic microscopy Microscopy Electronics manufacturing Flip chip X-rays Void Integrated circuit Solder Printed circuit board
10	Microsoft Word - Sonoscan - Copyrighted - SMTA ChinaAutomating C-SAM Process Control - From Lab to Fab and Back-End.doc Add to Reading List Source URL: www.sonoscan.com Language: English - Date: 2016-07-20 11:09:32 Semiconductor device fabrication Materials science Technology Acoustic microscopy Electromagnetism Wafer SMIF Microelectromechanical systems