Scanning probe microscopy

Results: 577



#Item
1Application Note In-situ Scanning Electron Microscope (SEM) supplements Scanning Probe Microscopy (SPM)

Application Note In-situ Scanning Electron Microscope (SEM) supplements Scanning Probe Microscopy (SPM)

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Source URL: www.orsayphysics.com

Language: English - Date: 2016-06-28 08:33:21
    2SPM Open Source Controller Model Mk2-A810 This DSP-based system has been specially designed to meet the Scanning Probe Microscopy (SPM) application requirements. The SPM Open Source Controller offers: 8 analog I/O capab

    SPM Open Source Controller Model Mk2-A810 This DSP-based system has been specially designed to meet the Scanning Probe Microscopy (SPM) application requirements. The SPM Open Source Controller offers: 8 analog I/O capab

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    Source URL: www.softdb.com

    - Date: 2015-04-02 10:53:25
      3HIGH RESOLUTION SCANNING PROBE MICROSCOPY OF BIONANOSTRUCTURES Klinov D.V.1,2 1 Russian Institute of Physico-Chemical Medicine, 119992, Moscow, Malaya Pirogovskaya 1a,

      HIGH RESOLUTION SCANNING PROBE MICROSCOPY OF BIONANOSTRUCTURES Klinov D.V.1,2 1 Russian Institute of Physico-Chemical Medicine, 119992, Moscow, Malaya Pirogovskaya 1a,

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      Source URL: www.physchem.msu.ru

      - Date: 2016-03-03 11:35:14
        4articles Discrete interactions in cell adhesion measured by single-molecule force spectroscopy Martin Benoit*†, Daniela Gabriel‡, Günther Gerisch‡ and Hermann E. Gaub*

        articles Discrete interactions in cell adhesion measured by single-molecule force spectroscopy Martin Benoit*†, Daniela Gabriel‡, Günther Gerisch‡ and Hermann E. Gaub*

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        Source URL: www.biophysik.physik.uni-muenchen.de

        Language: English - Date: 2015-11-10 10:48:39
        5Technology Opportunity, Ref. No. UAA novel algorithm for phase computation in atomic force microscopy A novel algorithm has been developed which provides highly accurate phase measurements. In particular, the al

        Technology Opportunity, Ref. No. UAA novel algorithm for phase computation in atomic force microscopy A novel algorithm has been developed which provides highly accurate phase measurements. In particular, the al

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        Source URL: www.switt.ch

        Language: English - Date: 2015-10-13 03:40:46
        6NANOSCOPY APPLICATION NOTE M03 Scanning Probe Microscopes for extreme Environments

        NANOSCOPY APPLICATION NOTE M03 Scanning Probe Microscopes for extreme Environments

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        Source URL: www.rockgateco.com

        Language: English - Date: 2014-02-03 00:20:25
        7Methods–178 Contents lists available at SciVerse ScienceDirect Methods journal homepage: www.elsevier.com/locate/ymeth

        Methods–178 Contents lists available at SciVerse ScienceDirect Methods journal homepage: www.elsevier.com/locate/ymeth

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        Source URL: www.biophysik.physik.uni-muenchen.de

        Language: English - Date: 2015-11-10 10:48:11
        8W NE www.ntmdt.com NTEGRA Spectra II – automated AFM-Raman, SNOM

        W NE www.ntmdt.com NTEGRA Spectra II – automated AFM-Raman, SNOM

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        Source URL: www.ntmdt.com

        Language: English - Date: 2016-05-20 01:52:50
        9nanoTOOLING APPLICATION NOTE PS01 Probe Stations for extreme Environments

        nanoTOOLING APPLICATION NOTE PS01 Probe Stations for extreme Environments

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        Source URL: www.rockgateco.com

        Language: English - Date: 2014-02-03 00:20:52
        10Initial Particle-Size Measurements For Arden July 1, 2010 APS Interference Microscope Tests • Microscope operated with 50x magnification and

        Initial Particle-Size Measurements For Arden July 1, 2010 APS Interference Microscope Tests • Microscope operated with 50x magnification and

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        Source URL: emop.fnal.gov

        Language: English - Date: 2015-02-02 16:40:42