Microstrip

Results: 135



#Item
91Modal Cross Power in Quasi-TEM Transmission Lines Dylan F. Williams, Senior Member, IEEE Frank Olyslager, Member, IEEE Abstract- This paper examines modal cross power in electromagnetic transmission lines. It shows that

Modal Cross Power in Quasi-TEM Transmission Lines Dylan F. Williams, Senior Member, IEEE Frank Olyslager, Member, IEEE Abstract- This paper examines modal cross power in electromagnetic transmission lines. It shows that

Add to Reading List

Source URL: www.eeel.nist.gov

Language: English - Date: 1998-03-15 16:38:56
92Characteristic Impedance of Microstrip on Silicon Dylan F. Williams, Senior Member, IEEE, and Bradley K. Alpert, Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed])

Characteristic Impedance of Microstrip on Silicon Dylan F. Williams, Senior Member, IEEE, and Bradley K. Alpert, Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed])

Add to Reading List

Source URL: www.eeel.nist.gov

Language: English - Date: 1999-08-10 15:40:12
93Characteristic Impedance Measurement of Planar Transmission Lines* Uwe Arz(1) , Dylan F. Williams(2), and Hartmut Grabinski[removed])

Characteristic Impedance Measurement of Planar Transmission Lines* Uwe Arz(1) , Dylan F. Williams(2), and Hartmut Grabinski[removed])

Add to Reading List

Source URL: www.eeel.nist.gov

Language: English - Date: 2002-08-06 11:56:37
94Line-Reflect-Match Calibrations with Nonideal Microstrip Standards1 Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]Jerry B. Schappacher, Member, IEEE

Line-Reflect-Match Calibrations with Nonideal Microstrip Standards1 Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]Jerry B. Schappacher, Member, IEEE

Add to Reading List

Source URL: www.eeel.nist.gov

Language: English - Date: 1998-03-15 16:38:38
95PCB Dielectric Material Selection and Fiber Weave Effect on High-Speed Channel Routing AN[removed]Application Note

PCB Dielectric Material Selection and Fiber Weave Effect on High-Speed Channel Routing AN[removed]Application Note

Add to Reading List

Source URL: www.altera.com

Language: English
96Comparison of Measured and Modeled Performance of a Tensioned Membrane Waveguide Array Antenna Glenn D. Hopkins1, Robin L. Cravey2, Dion T. Fralick2, David Lichodziejewski3, Fred Redell3, and M. C. Bailey4 1

Comparison of Measured and Modeled Performance of a Tensioned Membrane Waveguide Array Antenna Glenn D. Hopkins1, Robin L. Cravey2, Dion T. Fralick2, David Lichodziejewski3, Fred Redell3, and M. C. Bailey4 1

Add to Reading List

Source URL: www.lgarde.com

Language: English - Date: 2012-06-12 04:47:56
97Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul

Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul

Add to Reading List

Source URL: www.nist.gov

Language: English - Date: 2010-07-20 13:22:52
98Computation of Causal Characteristic Impedances Dylan F. Williams, Senior Member, IEEE, and Ronald C. Wittmann, Senior Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+1]

Computation of Causal Characteristic Impedances Dylan F. Williams, Senior Member, IEEE, and Ronald C. Wittmann, Senior Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+1]

Add to Reading List

Source URL: www.nist.gov

Language: English - Date: 2010-07-20 13:22:52
99Breakdown Voltage Measurements of Silicon Microstrip Detectors Zelalem Asmamaw Electrical Engineering Brown University

Breakdown Voltage Measurements of Silicon Microstrip Detectors Zelalem Asmamaw Electrical Engineering Brown University

Add to Reading List

Source URL: sist.fnal.gov

Language: English - Date: 2001-08-09 09:34:56
100Physics Division Research Review  LALP[removed]A Large-Format Gated X-Ray Framing Camera

Physics Division Research Review LALP[removed]A Large-Format Gated X-Ray Framing Camera

Add to Reading List

Source URL: wsx.lanl.gov

Language: English - Date: 2003-12-22 10:31:10