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Physical quantities / Resistor / Calibration / Microstrip / Electrical impedance / Transmission line / Scattering parameters / Characteristic impedance / Electronic engineering / Electromagnetism / Electronics


Line-Reflect-Match Calibrations with Nonideal Microstrip Standards1 Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]Jerry B. Schappacher, Member, IEEE
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Document Date: 1998-03-15 16:38:38

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File Size: 292,99 KB

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Portland / /

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IEEE National Institute of Standards and Technology / /

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resistive metal / passive device / metal thickness / metal mode decay constants / metal resistivity / /

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National Institute of Standards and Technology / /

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SHU XQLW OHQJWK OLQH FDSDFLWDQFH / Dylan F. Williams / /

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conductor / small adaptor Resistive Film Signal Conductor / /

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Colorado / Oregon / /

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broadband / dielectric / /

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