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Electromigration
Results: 49

#	Item
41	Microsoft Word - IPC Apex11 paper Ver_2_4 (EJW) Add to Reading List Source URL: www.dfrsolutions.com Language: English - Date: 2012-11-27 15:12:38 Failure Reliability engineering Maintenance Semiconductors Semiconductor device fabrication Reliability Hot carrier injection Electromigration Negative bias temperature instability Electronic engineering Systems engineering Technology
42	Electromigration and Its Impact on Physical Design in Future Technologies 1st Author Add to Reading List Source URL: www.ifte.de Language: English - Date: 2013-04-02 07:56:55 Electronics Electromigration Integrated circuits Electronic design Semiconductors Semiconductor device fabrication Physics of failure Electronic engineering Electronic design automation Electromagnetism
43	EE 311 /Prof Saraswat Spring 2003 Add to Reading List Source URL: www.stanford.edu Language: English - Date: 2004-04-27 18:33:50 Materials science Electromigration Electronic design automation Semiconductor device fabrication Current density Silicide Ohmic contact Electrical resistivity and conductivity Copper Chemistry Physics Matter
44	Compact Thermal Modeling for Temperature-Aware Design U NIVERSITY OF V IRGINIA D EPT. OF C OMPUTER S CIENCE T ECH . R EPORT CS[removed]∗ A PRIL 2004 Add to Reading List Source URL: www.cs.virginia.edu Language: English - Date: 2004-07-19 13:14:26 Physics Heat conduction Electronics manufacturing Electronic engineering Physical quantities Thermal resistance Electromigration Thermal conductivity R-value Mechanical engineering Heat transfer Chemical engineering
45	PDF Document Add to Reading List Source URL: www.ifte.de Language: English - Date: 2006-04-19 03:35:04 Physics Electromigration Integrated circuits Electronic design Semiconductors Semiconductor device fabrication Physics of failure Failure modes of electronics Electronic engineering Electromagnetism Electronic design automation
46	PDF Document Add to Reading List Source URL: www.gaas.org Language: English - Date: 2010-08-11 20:37:36 Electronic engineering Back end of line Chemical vapor deposition Integrated circuit Titanium nitride Capacitor Electromigration Low-k dielectric Semiconductor device fabrication Technology Chemistry
47	PDF Document Add to Reading List Source URL: nvl.nist.gov Language: English Chemistry Semiconductors Power electronics Safe operating area Transistor Integrated circuit Electromigration MOSFET Gallium nitride Electronic engineering Electronics Semiconductor devices
48	PDF Document Add to Reading List Source URL: people.maths.ox.ac.uk Language: English - Date: 2011-06-25 08:27:38 Fuse Polycrystalline silicon Tungsten disilicide Silicon Silicide Electromigration Solid Chemistry Matter Ceramic materials
49	PDF Document Add to Reading List Source URL: contact.rice.edu Language: English - Date: 2011-01-03 13:54:30 Semiconductor device fabrication Institute of Electrical and Electronics Engineers Hot carrier injection MOSFET Microfabrication Electromigration Materials science Electronic engineering Condensed matter physics