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Chipkill
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#	Item
1	LOT-ECC: LOcalized and Tiered Reliability Mechanisms for Commodity Memory Systems ∗ Aniruddha N. Udipi† † Naveen Muralimanohar‡ Add to Reading List Source URL: www.cs.utah.edu Language: English - Date: 2012-07-05 23:25:37 Digital media Chipkill Dynamic random-access memory RAM parity Soft error DIMM CPU cache Error detection and correction DDR3 SDRAM Computer memory Computer hardware Computing
2	An Empirical Study of Memory Hardware Errors in A Server Farm∗ Xin Li Michael C. Huang Kai Shen University of Rochester Add to Reading List Source URL: www.ece.rochester.edu Language: English - Date: 2007-05-11 10:18:44 Data Soft error Dynamic random-access memory Memory scrubbing Chipkill Hamming code Error detection and correction RAM parity Random-access memory Computer memory Computing Information
3	How memory RAS technologies can enhance the uptime of HP ProLiant servers: Reduce server crash rate by approximately 85% - Technical white paper Add to Reading List Source URL: h20195.www2.hp.com Language: English DIMM Dynamic random-access memory ProLiant Blade server RAM parity Server Xeon Random-access memory Chipkill Computer memory Computer hardware Computing
4	HC19Fault – Tolerant Design of the IBM POWER6 Microprocessor.v6.ppt Add to Reading List Source URL: www.hotchips.org Language: English - Date: 2013-07-27 23:58:01 POWER6 Chipkill CPU cache IBM POWER POWER5 Dynamic random-access memory Multi-core processor RAM parity IBM z10 Computer memory Computer hardware Computing
5	Error Checking and Correction (ECC) Controller Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-08-20 16:09:24 ECC memory Error detection and correction Interrupt Hamming code Information Universal asynchronous receiver/transmitter Chipkill Unbuffered memory Computer memory Computer architecture Computing
6	Soft Memory Errors and Their Effect on Sun Fire™ Systems Add to Reading List Source URL: docs.oracle.com Language: English - Date: 2010-12-20 08:39:06 Soft error RAM parity Dynamic random-access memory DIMM Random-access memory Sun Microsystems Page fault Sun Enterprise Chipkill Computer memory Computer hardware Computing
7	PDF Document Add to Reading List Source URL: www.tezzaron.com Language: English - Date: 2006-01-16 16:26:40 Electronic engineering Soft error Dynamic random-access memory ECC memory 1T-SRAM Memory scrubbing RAM parity Chipkill Error detection and correction Computer memory Computer hardware Electronics
8	PDF Document Add to Reading List Source URL: www.cs.rochester.edu Language: English - Date: 2010-05-08 22:21:05 Digital media ECC memory Dynamic random-access memory Chipkill RAM parity Error detection and correction Memory scrubbing Random-access memory Data corruption Computer memory Computer hardware Computing
9	PDF Document Add to Reading List Source URL: www.ece.umd.edu Language: English - Date: 2003-02-07 11:23:53 Digital media Chipkill ECC memory IBM System x RAM parity Dynamic random-access memory DIMM Random-access memory Server Computer memory Computer hardware Computing

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