Transistor

Results: 2038



#Item
881Electrical phenomena / Energy conversion / Photoelectric effect / Photovoltaics / Transistor / Infrared / Technology / Physics / Electromagnetism / Albert Einstein

DB_1. V18_Titel/Zubehır_en.qxp

Add to Reading List

Source URL: www.proavtomatika.ru

Language: English - Date: 2013-05-21 03:33:17
882Electronic design automation / Integrated circuits / Electronic design / Digital electronics / Signoff / Transistor model / Field-programmable gate array / Integrated circuit design / SPICE / Electronic engineering / Electronics / Electromagnetism

DesignCon[removed]Comprehensive Full-Chip Methodology to Verify EM and Dynamic Voltage Drop on High Performance FPGA Designs in

Add to Reading List

Source URL: www.xilinx.com

Language: English - Date: 2014-02-07 14:28:45
883Electronic circuits / Electronic filter / RF and microwave filter / Microwave / Transistor / Monolithic microwave integrated circuit / Dielectric resonator / Phase noise / Electromagnetic interference / Electronic engineering / Electronics / Electromagnetism

Spectrum Microwave Presentation 1 The Spectrum Family of Businesses Microwave Components & Systems Business | SpectrumMicrowave.com - Amplifiers, Mixers, Switches, Oscillators & Sources

Add to Reading List

Source URL: micro.apitech.com

Language: English - Date: 2010-10-18 16:29:58
884Threshold voltage / Electrical engineering / Field-effect transistor / MOSFET

2SK3018 Transistor 2.5V Drive Nch MOS FET 2SK3018 zExternal dimensions (Unit : mm)

Add to Reading List

Source URL: rohmfs.rohm.com

Language: English - Date: 2013-03-04 01:33:09
885Computer hardware / CMOS / Transistor / Dynamic random-access memory / Random-access memory / Renesas Electronics / High-k dielectric / Depletion-load NMOS logic / 1T-SRAM / Computer memory / Electronic engineering / Electronics

Next-generation Key CMOS Technologies 40nm Node CMOS Platform “UX8” FUKAI Toshinori, IKEDA Masahiro, TAKAHASHI Toshifumi, NATSUME Hidetaka Abstract The UX8 is the latest process from NEC Electronics. It uses the mos

Add to Reading List

Source URL: www.nec.com

Language: English - Date: 2012-09-11 09:28:34
886Semiconductor devices / Field-effect transistor / Contact resistance / Threshold voltage / Floating Gate MOSFET / Transistor / JFET / Depletion and enhancement modes / Self-aligned gate / Electrical engineering / Technology / Electromagnetism

2386 IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 36. NO. II. NOVEMBER 1989 A Floating-Gate Transmission-Line Model Technique for Measuring Source Resistance in Heterostructure

Add to Reading List

Source URL: www-mtl.mit.edu

Language: English - Date: 2013-04-16 14:15:16
887Technology / Insulated gate bipolar transistor / Power MOSFET / Gate turn-off thyristor / Transistor / Inductance / Diode / Inverter / Electrical engineering / Electromagnetism / Power electronics

Stability and Robustness Analysis of d/dt-Closed-Loop IGBT Gate Drive

Add to Reading List

Source URL: www.pes.ee.ethz.ch

Language: English - Date: 2013-07-03 06:12:47
888MOSFET / Field-effect transistor / Threshold voltage

2SK3019 Transistor 2.5V Drive Nch MOS FET 2SK3019 zDimensions (Unit : mm)

Add to Reading List

Source URL: rohmfs.rohm.com

Language: English - Date: 2013-03-04 01:33:11
889Bipolar junction transistor / Transistor / Electronics / Early effect / Biasing / Common emitter / Logic families / Integrated circuits / 2N2222 / Electrical engineering / Electronic engineering / Single-stage transistor amplifiers

\\ Proc. IEEE 2004 Int. Conference on Microelectronic Test Structures, Vol 17, March[removed]

Add to Reading List

Source URL: ece.wpi.edu

Language: English - Date: 2008-02-25 14:57:43
890Electromagnetism / Reliability engineering / Electronic engineering / Failure analysis / Maintenance / Problem solving / Fault / Integrated circuit / Transistor / Semiconductor devices / Failure / Electrical engineering

Innovative Common Technologies to Support State-of-the-Art Products Failure Analysis Technology for Advanced Devices ISHIYAMA Toshio, WADA Shinichi, KUZUMI Hajime, IDE Takashi Abstract

Add to Reading List

Source URL: www.nec.com

Language: English - Date: 2013-10-01 21:40:17
UPDATE