Failure analysis

Results: 2489



#Item
1Introspective Failure Analysis: Avoiding Correlated Failures in Peer-to-Peer Systems Hakim Weatherspoon, Tal Moscovitz and John Kubiatowicz Computer Science Division University of California, Berkeley

Introspective Failure Analysis: Avoiding Correlated Failures in Peer-to-Peer Systems Hakim Weatherspoon, Tal Moscovitz and John Kubiatowicz Computer Science Division University of California, Berkeley

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Source URL: fireless.cs.cornell.edu

Language: English - Date: 2010-08-03 12:36:01
    2FMEA  FMEA Failure Mode and Effects Analysis A Risk and Reliability Assessment Tool

    FMEA FMEA Failure Mode and Effects Analysis A Risk and Reliability Assessment Tool

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    Source URL: ewh.ieee.org

    - Date: 2011-11-22 22:49:38
      3Network Single Point of Failure Analysis via Model Finding1 Sanjai Narain Y.-H. Alice Cheng Alex Poylisher Rajesh Talpade

      Network Single Point of Failure Analysis via Model Finding1 Sanjai Narain Y.-H. Alice Cheng Alex Poylisher Rajesh Talpade

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      Source URL: alloy.mit.edu

      - Date: 2006-10-21 23:21:58
        4Study on a new approach to business failure and insolvency Comparative legal analysis of the Member States’ relevant provisions and practices Tender No. JUST/2014/JCOO/PR/CIVI/0075

        Study on a new approach to business failure and insolvency Comparative legal analysis of the Member States’ relevant provisions and practices Tender No. JUST/2014/JCOO/PR/CIVI/0075

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        Source URL: ec.europa.eu

        - Date: 2016-07-19 03:13:25
          5Engineering Failure Analysis–443  Contents lists available at ScienceDirect Engineering Failure Analysis journal homepage: www.elsevier.com/locate/efa

          Engineering Failure Analysis–443 Contents lists available at ScienceDirect Engineering Failure Analysis journal homepage: www.elsevier.com/locate/efa

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          Source URL: lightningsafety.com

          - Date: 2016-04-14 18:14:24
            6Characterization of Flip Chip Interconnect Failure Modes Using High Frequency Acoustic Micro Imaging With Correlative Analysis Janet E. Semmens and Lawrence W. Kessler SONOSCAN, INC. 530 East Green Street

            Characterization of Flip Chip Interconnect Failure Modes Using High Frequency Acoustic Micro Imaging With Correlative Analysis Janet E. Semmens and Lawrence W. Kessler SONOSCAN, INC. 530 East Green Street

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            Source URL: www.sonoscan.com

            - Date: 2016-07-20 11:09:32
              7ADMATEL (Advanced Device and Materials Testing Laboratory)  Address the failure analysis and testing gaps plaguing the country’s electronics and semiconductor industry.   PNS ISO/ IEC 17025:2005

              ADMATEL (Advanced Device and Materials Testing Laboratory)  Address the failure analysis and testing gaps plaguing the country’s electronics and semiconductor industry.  PNS ISO/ IEC 17025:2005

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              Source URL: www.itdi.dost.gov.ph

              Language: English
              8J.E.I. METALLURGICAL, INC. CONSULTING METALLURGICAL ENGINEERS 5514 HARBOR TOWN DALLAS, TEXASTELEPHONE: (FACSIMILE: (

              J.E.I. METALLURGICAL, INC. CONSULTING METALLURGICAL ENGINEERS 5514 HARBOR TOWN DALLAS, TEXASTELEPHONE: (FACSIMILE: (

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              Source URL: www.metallurgist.com

              Language: English - Date: 2016-02-18 16:48:38
              9Reliability modelling for long term digital preservation Panos Constantopoulos1,2, Martin Doerr2, Meropi Petraki2 1 Athens University of Economics and Business 2

              Reliability modelling for long term digital preservation Panos Constantopoulos1,2, Martin Doerr2, Meropi Petraki2 1 Athens University of Economics and Business 2

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              Source URL: delos-wp5.ukoln.ac.uk

              Language: English - Date: 2005-04-25 18:38:56
              10Ann Inst Stat Math:855–876 DOIs10463y Competing risks data analysis under the accelerated failure time model with missing cause of failure Ming Zheng · Renxin Lin · Wen Yu

              Ann Inst Stat Math:855–876 DOIs10463y Competing risks data analysis under the accelerated failure time model with missing cause of failure Ming Zheng · Renxin Lin · Wen Yu

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              Source URL: www.ism.ac.jp

              Language: English - Date: 2016-08-02 06:58:14