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Electrostatic force microscope
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1	Creation of 2D nanoparticle gradient crystals Master Thesis (6 months) or Master Project (8 weeks) Electrostatic repulsion between nanoparticles at the interface between two immiscible liquids (oil/water) makes it possib Add to Reading List Source URL: www.isa.mat.ethz.ch Language: English - Date: 2014-01-08 04:55:16 Colloidal chemistry Condensed matter physics Soft matter Electron microscope Microscopes Pathology Microscopy Nanowire Atomic-force microscopy Colloid Electron Nanoparticle
2	Microscopy: Science, Technology, Applications and Education A. Méndez-Vilas and J. Díaz (Eds.) ______________________________________________ Measuring dielectric properties at the nanoscale using Electrostatic Force M Add to Reading List Source URL: www.formatex.info Language: English - Date: 2011-02-11 05:42:59 Scanning probe microscopy Electricity Physical quantities Condensed matter physics Kelvin probe force microscope Electrostatic force microscope Capacitor Atomic force microscopy Relative permittivity Physics Electromagnetism Science
3	Field Enhancement and Work Function Difference of IrO2 Nano-Emitter Arrays using EFM and SKPM Spectroscopy D. C.-S. Chiang, Z.-F.P. Lei , R. Barrowcliff, F. Zhang * Washington State University Vancouver, WA 98686, Add to Reading List Source URL: www.nsti.org Language: English - Date: 2012-06-27 17:06:43 Chemistry Condensed matter physics Nanomaterials Intermolecular forces Kelvin probe force microscope Surface chemistry Electrostatic force microscope Nanorod Atomic force microscopy Physics Scanning probe microscopy Science
4	Microsoft Word - 2_Lab_UNIT 2_EFM_Final_rev07_Book.doc Add to Reading List Source URL: depts.washington.edu Language: English - Date: 2008-02-14 15:31:41 Chemistry Electrostatic force microscope Microscopy Nanosurf Nanotechnology Photoconductive atomic force microscopy Atomic force microscopy Scanning probe microscopy Science Scientific method
5	PointProbe® Plus XY-Alignment Series Silicon-SPM-Probes The XY-Alignment series comprises the well-established Alignment Chip with especially designed XY-Alignment probes enabling an easy and precise tip autoalignment. Add to Reading List Source URL: www.nanosensors.com Language: English Technology Materials science Nanosensors Magnetic force microscope AFM probe Electrostatic force microscope Microscopy Cantilever Nanotechnology Scanning probe microscopy Science
6	VOLUME 83, NUMBER 23 PHYSICAL REVIEW LETTERS Add to Reading List Source URL: www.columbia.edu Language: English - Date: 2002-08-01 15:57:26 Scanning probe microscopy Materials science Electricity Physical quantities Quantum electronics Quantum dot Electrostatic force microscope Capacitor Atomic force microscopy Chemistry Physics Science
7	Electric Force Microscopy (EFM) High Resolution and High Sensitivity Imaging of Electrostatic Force Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2009-12-27 18:00:00 Physics Kelvin probe force microscope Microscope Van der Waals force Capacitor Electrostatic force microscope Scanning probe microscopy Chemistry Science
8	PDF Document Add to Reading List Source URL: www.mpi-halle.mpg.de Language: English - Date: 2004-03-03 09:26:40 Science Atomic force microscopy Cantilever Hysteresis Ferroelectricity Force spectroscopy Electrostatic force microscope Vibration Resonance Physics Scanning probe microscopy Electromagnetism

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