Photoconductive atomic force microscopy

Results: 16



#Item
1NANOSCOPY  APPLICATION NOTE M15 Scanning Probe Microscopes for extreme Environments

NANOSCOPY APPLICATION NOTE M15 Scanning Probe Microscopes for extreme Environments

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Source URL: www.rockgateco.com

Language: English - Date: 2014-02-03 00:20:39
2NANOSCOPY  APPLICATION NOTE M14 Scanning Probe Microscopes for extreme Environments

NANOSCOPY APPLICATION NOTE M14 Scanning Probe Microscopes for extreme Environments

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Source URL: www.rockgateco.com

Language: English - Date: 2014-02-03 00:20:37
3Chemistry 445 Laboratories: Introduction The development of instrumentation and tools to characterize materials with sizes less than 100 nm has enabled the discovery of new phenomena. The breakthrough invention of the sc

Chemistry 445 Laboratories: Introduction The development of instrumentation and tools to characterize materials with sizes less than 100 nm has enabled the discovery of new phenomena. The breakthrough invention of the sc

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Source URL: chemgroups.northwestern.edu

Language: English - Date: 2004-07-01 09:39:26
4Mode Note  Conductive AFM Probing the Local Electronic Structure of a Sample’s Surface Figure 1. Schematic diagram of the XE-series Conductive AFM system

Mode Note Conductive AFM Probing the Local Electronic Structure of a Sample’s Surface Figure 1. Schematic diagram of the XE-series Conductive AFM system

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Source URL: www.nanowerk.com

Language: English - Date: 2009-12-27 18:00:00
5Efficient PV blends comprising more than two semiconductors Lacramioara Popescu,2 Patrick van ‘t Hof1, Floris Kooistra2, David Kronholm1, Alexander B. Sieval1, and Jan C. Hummelen2* 1. Solenne BV, Zernikepark 12 ,9747

Efficient PV blends comprising more than two semiconductors Lacramioara Popescu,2 Patrick van ‘t Hof1, Floris Kooistra2, David Kronholm1, Alexander B. Sieval1, and Jan C. Hummelen2* 1. Solenne BV, Zernikepark 12 ,9747

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Source URL: www.quantsol.org

Language: English - Date: 2010-05-11 12:44:47
6Flexible integrated research AFM  OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu

Flexible integrated research AFM OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu

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Source URL: www.ntmdt.ru

Language: English - Date: 2012-12-28 07:31:35
7Flexible integrated research AFM  OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu

Flexible integrated research AFM OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu

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Source URL: ntmdt.com

Language: English - Date: 2012-12-28 07:31:35
8Flexible integrated research AFM  OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu

Flexible integrated research AFM OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu

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Source URL: www.ntmdt.com

Language: English - Date: 2012-12-28 07:31:35
9Pure environment  NTEGRA Aura NTEGRA Aura Feel confident when everything is

Pure environment NTEGRA Aura NTEGRA Aura Feel confident when everything is

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Source URL: www.ntmdt.com

Language: English - Date: 2015-02-26 06:24:56
10Pure environment  NTEGRA Aura NTEGRA Aura Feel confident when everything is

Pure environment NTEGRA Aura NTEGRA Aura Feel confident when everything is

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Source URL: ntmdt.com

Language: English - Date: 2015-02-26 06:24:56