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Electromigration
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11	Copyright © 2012 American Scientiﬁc Publishers All rights reserved Printed in the United States of America Journal of Low Power Electronics Add to Reading List Source URL: euler.ecs.umass.edu Language: English - Date: 2012-11-06 11:44:32 Electronic engineering Electromagnetism Electronics Integrated circuits Electronic design automation Electronic design Semiconductor device fabrication Hardware Trojan Automatic test pattern generation Electromigration Reliability engineering Negative-bias temperature instability
12	SISPAD 2012, September 5-7, 2012, Denver, CO, USA Multi-Via Electromigration Lifetime Model Di-an Li, Zhong Guan, Malgorzata Marek-Sadowska Sani R. Nassif Add to Reading List Source URL: in4.iue.tuwien.ac.at Language: English - Date: 2013-02-12 08:39:10
13	Constant Voltage Electromigration for Advanced Interconnects TECHNICAL BRIEF After decades of reliance on Constant Current Electromigration (CIEM) to predict the electromigration lifetime of back end of line (BEOL) inter Add to Reading List Source URL: www.cascademicrotech.com Language: English - Date: 2015-04-17 19:38:56
14	Constant Voltage Electromigration for Advanced Interconnects TECHNICAL BRIEF After decades of reliance on Constant Current Electromigration (CIEM) to predict the electromigration lifetime of back end of line (BEOL) inter Add to Reading List Source URL: www.cmicro.com Language: English - Date: 2015-04-17 19:38:56
15	Microsoft Word - 2013_PhD_Call_For_Nominations_Flyer.doc Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2013-04-04 15:04:13 Engineering Symposium on VLSI Circuits IEEE Electron Devices Society Very-large-scale integration Leo Esaki Institute of Electrical and Electronics Engineers Electromigration International Electron Devices Meeting Chih-Tang Sah Electronic engineering Semiconductors Electronics
16	APRIL 2010 VOL. 17, NO. 2 ISSN: TABLE OF Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:22 Electronics Symposium on VLSI Circuits IEEE Electron Devices Society Very-large-scale integration International Electron Devices Meeting Institute of Electrical and Electronics Engineers IEEE Technical Activities Board Electromigration Microfabrication Electronic engineering Semiconductors Engineering
17	"Failure-Assessment Software For Circuit-Card Assemblies", M. Osterman, and T. Stadterman. Proc. for the Annual Reliability and Maintainability Symposium, pp, JanFailure Assessment Software for Circuit Ca Add to Reading List Source URL: www.calce.umd.edu Language: English - Date: 2007-09-07 15:11:53 Materials science Design Maintenance Electronic design Survival analysis Physics of failure Reliability Failure causes Electromigration Systems engineering Reliability engineering Failure
18	CALL FOR PAPERS ROCS Workshop Reliability Of Compound Semiconductors Monday May 18, 2015 Add to Reading List Source URL: www.jedec.org Language: English - Date: 2015-01-26 10:05:38 Semiconductors JEDEC Semiconductor device fabrication Materials science Semiconductor devices Reliability Electromigration Light-emitting diode Compound semiconductor Electronic engineering Electromagnetism Technology
19	Vt Variation Effects on Lifetime Reliability Brian Greskamp Smruti R. Sarangi Josep Torrellas Add to Reading List Source URL: iacoma.cs.uiuc.edu Language: English - Date: 2010-12-24 11:30:50 Systems engineering Systems science Electronic design automation Design for X Mean time between failures Electromigration Failure Survival analysis Reliability engineering
20	eFuse Design and Reliability William R. Tonti FIEEE IEEE Director of Future Directions 445 Hoes lane, Piscataway NY[removed]removed] Add to Reading List Source URL: rs.ieee.org Language: English - Date: 2011-07-27 09:23:59 Electrical engineering Electronic design automation Failure Electromigration Fuse Reliability engineering Polycrystalline silicon Electrode Electromagnetism Electrical components Technology