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Survival analysis / Failure / Semiconductors / Maintenance / Semiconductor device fabrication / Hot-carrier injection / Reliability / Electromigration / MOSFET / Prognostics / Integrated circuit / Failure rate


Microsoft Word - Prognostic Techniques for Deep Submicron Semiconductors[1].
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Document Date: 2015-07-18 01:30:09


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File Size: 125,42 KB

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