Device under test

Results: 23



#Item
1

The Buffer Op AmpThe Buffer Op Amp is an amplifier with 9 dB gain based on the OPA695. Two such amps fit on a single SLIM board. They can be used with the MSA to provide a 50-ohm interface to a device under test

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Source URL: www.wetterlin.org

Language: English - Date: 2009-12-12 15:18:58
    2Measurement / Physics / Ununtrium / Measuring instrument / Power supply / Luminance / Device under test / AC adapter / Engineering / Environmental stress screening / ATML

    ENERGY STAR® Program Requirements Product Specification for Displays Test Method for Determining Displays Energy Use Version 6.0 – Final

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    Source URL: www.eu-energystar.org

    Language: English - Date: 2015-08-17 07:41:16
    3Electromagnetism / Electric power / Electricity / Engineering / Product testing / Electrical engineering / Power supply / Utility frequency / Alternating current / Device under test / Energy Star / Environmental stress screening

    FINAL Version 2.0 Imaging Equipment Program Requirements (Rev Octdoc

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    Source URL: www.eu-energystar.org

    Language: English - Date: 2015-08-17 07:41:36
    4Semiconductor device fabrication / Electronic engineering / Design for X / Electronic design automation / Coupon / Reliability / Integrated circuit design / Fabless manufacturing / Device under test / Electromigration

    Rapid Characterization Method for New Semiconductor Processes Esko Mikkola, Ph.D., & Andrew Levy Ridgetop Group IncWest Ina Road Tucson, AZUSA

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    Source URL: www.ridgetopgroup.com

    Language: English - Date: 2015-07-18 01:30:09
    5Electromagnetism / Product testing / Electromagnetic compatibility / Electrical engineering / EUT / Antenna / CISPR / IEEE 802.11 / Device under test / Radio / Coaxial cable / NEMKO

    ONE WORLD OUR APPROVAL Test report4TRFWL

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    Source URL: processors.wiki.ti.com

    Language: English - Date: 2015-01-08 19:47:02
    6Universal Serial Bus / Wireless USB / Device under test / Booting / Manufacturing / Electronics / Automatic test equipment / USB / Technology / Wireless networking

    Wireless USB Device Interoperability Test Vendor: Device Identification: TID: 1. Boot system, insure Wireless USB Host (Host) is operating

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    Source URL: www.usb.org

    Language: English - Date: 2013-12-06 17:58:38
    7Throughput / Electronic test equipment / Technology / Electronics / Electromagnetism / Electronic engineering / Device under test / Semiconductor device fabrication

    octoBox Testbed and Software User’s Guide October, 2014 Contents

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    Source URL: www.octoscope.com

    Language: English - Date: 2014-10-18 20:12:46
    8Electronics manufacturing / Electronic engineering / Embedded systems / Field-programmable gate array / Xilinx / DUT board / Device under test / Joint Test Action Group / LabVIEW / Electronics / Manufacturing / Technology

    T021607_XC4VFX60 Synopsis V1.0 Heavy ion SEE test of Virtex4 FPGA XC4VFX60 from Xilinx Christian Poivey1, Melanie Berg1, Scott Stansberry2, Mark Friendlich1, Hak Kim1, Dave Petrick3, Ken LaBel3

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    Source URL: www.klabs.org

    Language: English - Date: 2010-03-13 19:08:56
    9Nondestructive testing / Device under test / Technology / Naval Air Systems Command / Measurement / Manufacturing / Automatic test equipment / Electronic test equipment

    Microsoft Word - CASS Family OTPS Sustainment Process - Version 1.1.doc

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    Source URL: www.acq.osd.mil

    Language: English - Date: 2009-09-02 15:10:14
    10Universal Serial Bus / Manufacturing / Continuous integration / Technology / USB flash drive / OpenSUSE / Software / Electronic engineering / Device under test / Semiconductor device fabrication

    Automated Flashing and Testing for Continuous Integration Igor Stoppa Embedded Linux Conference North America 2015

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    Source URL: events.linuxfoundation.org

    Language: English - Date: 2015-03-19 12:28:42
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