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Scanning probe microscopy / Charge carriers / Ballistic electron emission microscopy / Schottky barrier / Ohmic contact / Hot carrier injection / Inelastic electron tunneling spectroscopy / Work function / Threshold voltage / Physics / Condensed matter physics / Electromagnetism
Scanning probe microscopy
Charge carriers
Ballistic electron emission microscopy
Schottky barrier
Ohmic contact
Hot carrier injection
Inelastic electron tunneling spectroscopy
Work function
Threshold voltage
Physics
Condensed matter physics
Electromagnetism

Microsc. MicroanaL Microstruct. 31-

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