T-beam

Results: 202



#Item
81

NUMERICAL SIMULATION OF THE BEAM-PLASMA TURBULENCE SPECTRUM EVOLUTION FOR WEAK BEAMS I.O.Anisimov, T.V.Siversky Taras Shevchenko National University of Kyiv, Radio Physics Faculty Kyiv, Ukraine, The resu

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Source URL: www.kipt.kharkov.ua

Language: English - Date: 2009-07-14 07:20:34
    82Linear particle accelerator / High voltage / Diode / Electromagnetism / Physics / Particle accelerators

    OPERATION OF THE MOSCOW MESON FACTORY LINAC PROTON INJECTOR WITH THE PULSE DURATION OF THE BEAM CURRENT UP TO 150 µS A.S.Belov, V.N.Zubetz, V.I.Derbilov, S.K.Esin, E.S.Nikulin, P.N.Ostroumov, O.T.Frolov, V.P.Yakushev In

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    Source URL: www.kipt.kharkov.ua

    Language: English - Date: 2009-07-14 07:19:53
    83

    T E M E S C A L P R E C I S I O N C O AT I N G S O L U T I O N S U N D ER S TA N D I N G T H E S CI E A vapor cloud forms the heart of every electron beam

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    Source URL: temescal.net

    Language: English - Date: 2015-03-09 13:09:45
      84

      §19. Measurement of Edge Plasma Fluctuation by 2-D Thermal Li Beam Ohno, N., Takagi, M., Okamoto, M. (Nagoya Univ.), Morisaki, T., Masuzaki, S., Komori, A., Tsuchiya, H., Yamauchi, K., Taniguchi, Y.

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      Source URL: www.nifs.ac.jp

      - Date: 2013-12-18 20:55:37
        85Microscopes / Electron beam / Transmission electron microscopy / Scanning transmission electron microscopy / Electron microscope / Electron energy loss spectroscopy / Scanning electron microscope / Scientific method / Electron microscopy / Science

        p r o d u c t d ata 2 Tecnai™ G F30 The benchmark for high

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        Source URL: www.emc.missouri.edu

        Language: English - Date: 2012-07-09 12:57:09
        86Carrier scattering / Electron beam / Electron beam induced current / Semiconductor device fabrication

        F R A U N H O F E R I N S T I T U T E F O R I N T E G R AT E D S Y S T E M S A N D D E V I C E T E C H N O L O G Y 1 1

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        Source URL: www.iisb.fraunhofer.de

        Language: English - Date: 2015-06-08 11:56:43
        87Manufacturing / Thin film deposition / Superhard materials / Electron beam / Electron beam induced current / Silicon carbide / Fraunhofer Society / Epitaxy / Micropipe / Chemistry / Semiconductor device fabrication / Materials science

        F r a u n h o f e r I n s t i t u t e f o r I n t e g r at e d S y s t e m s a n d D e v i c e T e c h n o l o g y 1 2

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        Source URL: www.iisb.fraunhofer.de

        Language: English - Date: 2015-06-08 13:41:42
        88Microscopy / Semiconductor device fabrication / Mechanical failure / Physics of failure / Failure analysis / Focused ion beam / Electron microscope / Optical microscope / Scanning SQUID microscope / Scientific method / Science / Electron microscopy

        F R A U N H O F E R I N S T I T U T E F O R I N T E G R AT E D S Y S T E M S A N D D E V I C E T E C H N O L O G Y 1 1

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        Source URL: www.iisb.fraunhofer.de

        Language: English - Date: 2015-06-08 12:51:01
        89Engineering / I-beam / Welded wire mesh / Screw / Structural steel / Mesh / Lumber / Beam / Roof / Structural engineering / Civil engineering / Construction

        Channels, Mats, Beams, Mesh T-CHANNELS Description • 7-gauge channels have tensile strength of 60,000 psi • Increased strength and safety, compared with roof mats

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        Source URL: www.jennmar.com

        Language: English - Date: 2014-08-28 14:36:47
        90Optical devices / Measuring instruments / Spectroscopy / Monochromator / X-ray / Laser beam profiler / Diffractometer / Crystallography / Ionizing radiation / Physics / Science / Scientific method

        Microfocus X-ray Sources for Short Wavelength Radiation J. Graf1, B. Hasse1, C. Michaelsen1, F. Fabbiani2, T. Schulz3, D. Stalke3, C. W. Lehmann4, M. Ruf5 1 Incoatec GmbH, 21502 Geesthacht, Germany; 2 Geowissenschaftlich

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        Source URL: www.incoatec.de

        Language: English - Date: 2014-03-18 12:34:12
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