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Static secondary-ion mass spectrometry
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1	USPAS - Fundamentals of Ion Sources 7. Multicusp Ion Sources II Daniela Leitner (LBNL, MSU), Damon Todd (LBNL), Daniel Winklehner (MIT) Add to Reading List Source URL: www-eng.lbl.gov Language: English - Date: 2016-02-19 10:50:04 Ion source Charge carriers Mass spectrometry Astrophysics Physical chemistry Electron Ion Electric current Plasma Electron beam ion trap Static secondary-ion mass spectrometry
2	the CSR could be successfully cooled down confirming the required cryogenic temperatures in the experimental vacuum chambers as well as the mechanical stability of the CSR ion optics. On March 17, 2014 the CSR project re Add to Reading List Source URL: www.mpi-hd.mpg.de Language: English - Date: 2014-07-21 09:54:04 Mass spectrometry Charge carriers Ions Semiconductor device fabrication Max Planck Institute for Nuclear Physics Vacuum Electron Static secondary-ion mass spectrometry Secondary ion mass spectrometry Physics Chemistry Science
3	Photon Factory Activity Report 2012 #B BL-2C/2010G541 A High-Resolution 2p→3d Photoexcitation Spectrum of Atomic Mn Ken KAWAJIRI1, Satoshi KOSUGI1, Norihiro SUZUKI1, Minato KENMOTSU1, Tatsuro NAGOSHI1 Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2013-09-26 20:31:26 Materials science Measuring instruments Chemical pathology Time of flight Photoelectrochemical processes Mass spectrum Time-of-flight mass spectrometry Static secondary-ion mass spectrometry Chemistry Mass spectrometry Spectroscopy
4	OXFORD APPLIED RESEARCH Low Energy Ion Source- LIon50 Specimen cleaning, Ion spectroscopy. 30eV - 1keV Add to Reading List Source URL: www.oaresearch.co.uk Language: English - Date: 2015-04-23 17:42:59 Ions Thin film deposition Mass spectrometry Ion source Semiconductor device fabrication Ion beam Electron Ion gun Static secondary-ion mass spectrometry Chemistry Physics Scientific method
5	Invited Lecture Title: Surface analysis for industrial and biomedical applications: A ToF-SIMS perspective of biomolecules Speaker：Dr. Ivan Kempson Senior Research Fellow, University of South Australia Date &Time：10: Add to Reading List Source URL: english.ipe.cas.cn Language: English - Date: 2014-06-06 02:17:53 Secondary ion mass spectrometry Static secondary-ion mass spectrometry Mass spectrometry Scientific method Science
6	BOOK REVIEWS SECONDARY ION MASS SPECTROMETRY IN THE EARTH SCIENCES* The Mineralogical Association of Canada Short Course Series Volume 41, Secondary Ion Mass Spectrometry in the Earth Sciences – Gleaning the Add to Reading List Source URL: www.elementsmagazine.org Language: English - Date: 2010-04-14 07:53:24 Science Secondary ion mass spectrometry Sputtering Ion beam Static secondary-ion mass spectrometry Sensitive high-resolution ion microprobe Chemistry Mass spectrometry Scientific method
7	Atmos. Chem. Phys., 14, 10547–10563, 2014 www.atmos-chem-phys.netdoi:acp © Author(sCC Attribution 3.0 License. Ion – particle interactions during particle formation and Add to Reading List Source URL: www.atmos-chem-phys.net Language: English - Date: 2014-10-09 08:53:46 Ion source Ions Ion Alpha particle Corona discharge Static secondary-ion mass spectrometry Chemistry Physics Radioactivity
8	SIMS – Basic Concepts & Design The Basics Secondary Ion Mass Spectrometry (SIMS), also known as the ion probe, is a ‘destructive’ analytical technique. This means that part of the sample is physically removed by th Add to Reading List Source URL: jdlc.curtin.edu.au Language: English - Date: 2015-03-22 22:48:10 Laboratory techniques Secondary ion mass spectrometry Ion source Sensitive high-resolution ion microprobe Sputtering Sector instrument Ion Static secondary-ion mass spectrometry Focused ion beam Chemistry Mass spectrometry Scientific method
9	REVIEW OF SCIENTIFIC INSTRUMENTS 76, 103301 共2005兲 Technique for increasing dynamic range of space-borne ion composition instruments J. L. Burch, G. P. Miller, A. De Los Santos, C. J. Pollock, S. E. Pope, P. W. Vale Add to Reading List Source URL: mms.space.swri.edu Language: English - Date: 2008-11-13 09:17:41 Time of flight Plasma Static secondary-ion mass spectrometry Mass spectrometry Chemistry Scientific method
10	Koichi Tanaka - Nobel Lecture Add to Reading List Source URL: www.nobelprize.org Language: English - Date: 2006-05-31 16:47:59 Analytical chemistry Time-of-flight mass spectrometry Reflectron Delayed extraction Time of flight Chemical ionization Ion Matrix-assisted laser desorption/ionization Static secondary-ion mass spectrometry Chemistry Mass spectrometry Laboratory techniques

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