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![]() Date: 2011-09-05 21:04:12Nanotechnology Atomic force microscopy Near-field scanning optical microscope Microscopy Scanning thermal microscopy Local oxidation nanolithography Polymeric surfaces Chemical force microscopy Magnetic force microscope Scanning probe microscopy Chemistry Science | Add to Reading List |
![]() | SISPAD 2012, September 5-7, 2012, Denver, CO, USA Simulations of Local Oxidation Nanolithography by AFM Based on the Generated Electric Field L. Filipovic∗† and S. Selberherr∗ ∗ InstituteDocID: 1lK5v - View Document |
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![]() | ISSN 10637826, Semiconductors, 2014, Vol. 48, No. 13, pp. 1757–1762. © Pleiades Publishing, Ltd., 2014. Original Russian Text © V.I. Avilov, O.A. Ageev, A.S. Kolomiitsev, B.G. Konoplev, V.A. Smirnov, O.G. Tsukanova,DocID: 11pi4 - View Document |
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