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Scanning probe microscopy / Technology / Electrical components / Memristor / Titanium dioxide / Titanium / Local oxidation nanolithography / Atomic force microscopy / Resistive random-access memory / Chemistry / Emerging technologies / Matter


ISSN 10637826, Semiconductors, 2014, Vol. 48, No. 13, pp. 1757–1762. © Pleiades Publishing, Ltd., 2014. Original Russian Text © V.I. Avilov, O.A. Ageev, A.S. Kolomiitsev, B.G. Konoplev, V.A. Smirnov, O.G. Tsukanova,
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Document Date: 2015-01-21 05:36:16


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