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Date: 2008-07-17 09:43:08 Microbiology Intermolecular forces Atomic force microscopy Nanotechnology Microscopy Cantilever Acoustic microscopy Microscope Science Scanning probe microscopy Scientific method		Add to Reading List Source URL: www.ntmdt.ru Download Document from Source Website File Size: 1,52 MB Share Document on Facebook

	Development of a Resolution Test Wafer for Use in Acoustic Microscopy of Microelectronic Devices Janet E. Semmens1, Rupert Fischer2, and Lawrence W. Kessler1 1 Sonoscan, IncE. Pratt Blvd. DocID: 1s5gm - View Document
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	US008720273B2United States Patent Kessler et a1. (54) DocID: 1qZ0u - View Document