Random dopant fluctuation

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1Electromagnetism / Semiconductor device fabrication / MOSFET / Threshold voltage / Transistors / Doping / Field-effect transistor / Random dopant fluctuation / Gate oxide / Electrical engineering / Semiconductor devices / Electronic engineering

Quantum corrections to the 'atomistic' MOSFET simulation - Computational Electronics, 2000. Book of Abstracts. IWCE Glasgow[removed]7th International Workshop

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Source URL: eprints.gla.ac.uk

Language: English - Date: 2011-08-15 10:02:41
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