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 Date: 2014-03-27 14:06:28International Technology Roadmap for Semiconductors Integrated circuit Electronic engineering 16 nanometer 180 nanometer 90 nanometer 22 nanometer Microtechnology Low-k dielectric Materials science |
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INTERNATIONAL TECHNOLOGY ROADMAP FOR SEMICONDUCTORS[removed]EDITION | Small-scale Tests for Identifying Explosivity Jimmie C. Oxley; James L. Smith; Patrick R. Bowden; Ryan Rettinger University of Rhode Island; Technical ApproachDocID: 1qutn - View Document |
| Statistical variability shapes the future of CMOS Keynote talk from the CEO of GSS at the DATE VAMM Workshop The CEO of Gold Standard Simulations, Professor Asen Asenov, will deliver a keynote talk on variability in emerDocID: 1aK0w - View Document |
| INVESTOR MEETING 2014 William Holt Executive Vice President General Manager, Technology and Manufacturing Group Key Messages from 2013DocID: 14dCd - View Document |
| HC19Panel - What's Next Beyond CMOS? Shahidi_HOT_Rump V3.pptDocID: 114nm - View Document |
| Microsoft PowerPoint - CAT_Program_Overview_7-24-09_V5DocID: VuDF - View Document |