MOSFET

Results: 875



#Item
291Electromagnetism / Semiconductor devices / MOSFET / Electronic engineering / Negative bias temperature instability / Hot carrier injection / Transistor / Thin-film transistor / VLAN Trunking Protocol / Technology / Semiconductors / Condensed matter physics

506 IEEE ELECTRON DEVICE LETTERS, VOL. 32, NO. 4, APRIL 2011 A New Observation of the Elliot Curve Waveform in Charge Pumping of Poly-Si TFTs

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Source URL: www.pskl.ust.hk

Language: English - Date: 2014-10-10 02:44:39
292MOSFET

109 Woods of Arden Road Staten Island NY[removed]Office: ([removed]Fax: : ([removed]Images SI Inc.

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Source URL: www.imagesco.com

Language: English - Date: 2010-05-06 19:39:42
    293MOSFET / Field-effect transistor / Diode / Hot carrier injection / Transistor / Condensed matter physics / Technology / Electromagnetism

    Substrate Current and Its Correlation with Degradation of Poly-Si Thin Film Transistors 1 2

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    Source URL: www.pskl.ust.hk

    Language: English - Date: 2014-10-10 02:44:40
    294Chemistry / Matter / MOSFET / Polycrystalline silicon / Polysilicon hydride

    Optimization of Charge Pumping Technique in Polysilicon TFTs for Geometric Effect Elimination and Trap State Density Extraction Lei Lu, Mingxiang Wang·, Man Wong l Dept. of Microelectronics, Soochow University, Suzhou 2

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    Source URL: www.pskl.ust.hk

    Language: English - Date: 2014-10-10 02:44:40
    295Semiconductor devices / Digital electronics / Integrated circuits / MOSFET / 11 nanometer / Indium gallium arsenide / Gate oxide / International Electron Devices Meeting / Transistor / Electronic engineering / Electronics / Chemistry

    [removed]A New Self-Aligned Quantum-Well MOSFET Architecture Fabricated by a Scalable Tight-Pitch Process

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    Source URL: www-mtl.mit.edu

    Language: English - Date: 2014-04-22 16:21:50
    296Electromagnetism / Integrated circuits / Logic families / Electronic circuits / Open collector / Logic level / Pull-up resistor / CMOS / MOSFET / Electronic engineering / Digital electronics / Electronics

    Freescale Semiconductor Technical Data Document Number: MC33887 Rev. 16.0, [removed]

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    Source URL: cache.freescale.com

    Language: English - Date: 2012-10-11 13:27:28
    297Integrated circuits / Logic families / Digital electronics / Semiconductors / MOSFET / CMOS / Field-effect transistor / Threshold voltage / Hot carrier injection / Electronic engineering / Electromagnetism / Electrical engineering

    OPTIMIZATION AND CHARACTERIZATION OF 130 NM CMOS TRANSISTOR DESIGN USING TCAD SIMULATION HANI NOORASHIQIN BINTI ABD. MAJID FACULTY OF SCIENCE

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    Source URL: dspace.fsktm.um.edu.my

    Language: English - Date: 2010-02-04 01:52:29
    298Integrated circuits / Voltage regulator / Capacitor / Decoupling capacitor / Power supply / Operational amplifier / Accelerometer / MOSFET / IC power supply pin / Electronics / Electronic engineering / Electromagnetism

    DE-ACCM3D Buffered ±3g Tri-axis Accelerometer General Description The DE-ACCM3D is a complete 3D ±3g analog accelerometer solution. It features integrated op amp buffers for direct connection to a microcontroller’s a

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    Source URL: www.dimensionengineering.com

    Language: English - Date: 2012-04-06 12:35:56
    299Physics / Electromagnetism / Electrical engineering / Contact resistance / Ohmic contact / MOSFET / Indium gallium arsenide / Electrical resistivity and conductivity / Transistor / Materials science / Chemistry / Physical quantities

    178 IEEE ELECTRON DEVICE LETTERS, VOL. 35, NO. 2, FEBRUARY 2014 A Test Structure to Characterize Nano-Scale Ohmic Contacts in III–V MOSFETs

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    Source URL: www-mtl.mit.edu

    Language: English - Date: 2014-04-22 16:07:00
    300Polycrystalline silicon / MOSFET / Transistor / Thin-film transistor / Technology / Condensed matter physics / Matter / Semiconductor devices / Semiconductors / Crystals

    IEEE ELECTRON DEVICE LETTERS, VOL. 30, NO. 5, MAY[removed]Geometric Effect Elimination and Reliable Trap State Density Extraction in Charge Pumping of

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    Source URL: www.pskl.ust.hk

    Language: English - Date: 2014-10-10 02:44:39
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