Math in Special Effects Try other challenges Answer Key FINAL[removed]

First Page		Document Content
Date: 2014-08-07 13:02:46 Physical optics Aperture Observational astronomy F-number Camera lens Depth of field Entrance pupil Optics Science of photography Geometrical optics		Math in Special Effects Try other challenges Answer Key FINAL[removed] Add to Reading List Source URL: www.thirteen.org Download Document from Source Website File Size: 76,96 KB Share Document on Facebook

	KNMF Laboratory for Microscopy and Spectroscopy Helium Ion Microscope (HIM) The Zeiss Orion NanoFab allows high-resolution imaging with high surface sensitivity and a depth-of-field 5-10 times higher than in a modern FE DocID: 1v5d9 - View Document
	Performance of extended depth of field systems and theoretical diffraction limit Frédéric Guichard, Frédéric Cao, Imène Tarchouna, Nicolas Bachelard DxO Labs, 3 Rue Nationale, 92100 Boulogne, France ABSTRACT Extende DocID: 1uL14 - View Document
	Extended depth-of-field using sharpness transport across color channels Frédéric Guichard1, Hoang Phi Nguyen, Régis Tessières, Marine Pyanet, Imène Tarchouna, Frédéric Cao DxO Labs, 3 Rue Nationale, 92100 Boulogne DocID: 1ulr1 - View Document
	Non-Linear Aperture for Stylized Depth of Field Adrien Bousseau - INRIA / Grenoble University (a) Pinhole (b) Average DocID: 1tFBM - View Document
	NonLinear Aperture for Stylized Depth of Field Adrien Bousseau INRIA / Grenoble University Lightfield data from http://lightfield.stanford.edu/ Pinhole aperture DocID: 1tDpF - View Document