Depth of field

Results: 199



#Item
1KNMF Laboratory for Microscopy and Spectroscopy  Helium Ion Microscope (HIM) The Zeiss Orion NanoFab allows high-resolution imaging with high surface sensitivity and a depth-of-field 5-10 times higher than in a modern FE

KNMF Laboratory for Microscopy and Spectroscopy Helium Ion Microscope (HIM) The Zeiss Orion NanoFab allows high-resolution imaging with high surface sensitivity and a depth-of-field 5-10 times higher than in a modern FE

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Source URL: www.knmf.kit.edu

Language: English - Date: 2018-03-27 09:44:43
    2Performance of extended depth of field systems and theoretical diffraction limit Frédéric Guichard, Frédéric Cao, Imène Tarchouna, Nicolas Bachelard DxO Labs, 3 Rue Nationale, 92100 Boulogne, France ABSTRACT Extende

    Performance of extended depth of field systems and theoretical diffraction limit Frédéric Guichard, Frédéric Cao, Imène Tarchouna, Nicolas Bachelard DxO Labs, 3 Rue Nationale, 92100 Boulogne, France ABSTRACT Extende

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    Source URL: corp.dxomark.com

    Language: English - Date: 2017-11-24 09:13:37
      3Extended depth-of-field using sharpness transport across color channels Frédéric Guichard1, Hoang Phi Nguyen, Régis Tessières, Marine Pyanet, Imène Tarchouna, Frédéric Cao DxO Labs, 3 Rue Nationale, 92100 Boulogne

      Extended depth-of-field using sharpness transport across color channels Frédéric Guichard1, Hoang Phi Nguyen, Régis Tessières, Marine Pyanet, Imène Tarchouna, Frédéric Cao DxO Labs, 3 Rue Nationale, 92100 Boulogne

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      Source URL: corp.dxomark.com

      Language: English - Date: 2017-11-24 09:13:40
        4Non-Linear Aperture for Stylized Depth of Field Adrien Bousseau - INRIA / Grenoble University (a) Pinhole  (b) Average

        Non-Linear Aperture for Stylized Depth of Field Adrien Bousseau - INRIA / Grenoble University (a) Pinhole (b) Average

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        Source URL: artis.imag.fr

        - Date: 2009-05-28 10:22:16
          5Non­Linear Aperture for Stylized Depth of Field Adrien Bousseau ­ INRIA / Grenoble University Lightfield data from http://lightfield.stanford.edu/ Pinhole aperture

          Non­Linear Aperture for Stylized Depth of Field Adrien Bousseau ­ INRIA / Grenoble University Lightfield data from http://lightfield.stanford.edu/ Pinhole aperture

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          Source URL: artis.imag.fr

          - Date: 2009-07-27 11:01:52
            6May 26, 2015  New EV-L500C1 - 5 Megapixel Extended Depth of Field Camera with Three Dedicated Lenses

            May 26, 2015 New EV-L500C1 - 5 Megapixel Extended Depth of Field Camera with Three Dedicated Lenses

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            Source URL: www.ricoh-mv-security.eu

            - Date: 2015-06-03 09:24:43
              7Using an Eye-Tracking System to Improve Camera Motions and Depth-of-Field Blur Effects in Virtual Environments ´ Sebastien Hillaire∗

              Using an Eye-Tracking System to Improve Camera Motions and Depth-of-Field Blur Effects in Virtual Environments ´ Sebastien Hillaire∗

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              Source URL: cristal.univ-lille.fr

              - Date: 2009-05-07 03:11:43
                8Using an Eye-Tracking System to Improve Camera Motions and Depth-of-Field Blur Effects in Virtual Environments ´ Sebastien Hillaire∗

                Using an Eye-Tracking System to Improve Camera Motions and Depth-of-Field Blur Effects in Virtual Environments ´ Sebastien Hillaire∗

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                Source URL: mjolnir.lille.inria.fr

                - Date: 2009-05-07 03:11:43
                  9Range Finding using a Masked Annular Folded Optic Imager Brett R. Nadler, Eric J. Tremblay*, Jason H. Karp* and Joseph E. Ford* * Department of Mechanical Engineering, Univ. of Calif. San Diego, La Jolla, CA 92093; Depar

                  Range Finding using a Masked Annular Folded Optic Imager Brett R. Nadler, Eric J. Tremblay*, Jason H. Karp* and Joseph E. Ford* * Department of Mechanical Engineering, Univ. of Calif. San Diego, La Jolla, CA 92093; Depar

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                  Source URL: psilab.ucsd.edu

                  Language: English - Date: 2009-10-21 19:35:41
                  10Joint EUROGRAPHICS - IEEE TCVG Symposium on VisualizationD. Ebert, P. Brunet, I. Navazo (Editors) Useful Properties of Semantic Depth of Field for Better F+C Visualization Helwig Hauser

                  Joint EUROGRAPHICS - IEEE TCVG Symposium on VisualizationD. Ebert, P. Brunet, I. Navazo (Editors) Useful Properties of Semantic Depth of Field for Better F+C Visualization Helwig Hauser

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                  Source URL: kosara.net

                  Language: English - Date: 2015-10-05 00:14:13