Ellipsometry

Results: 88



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1Spectroscopic ellipsometry investigation of amorphous carbon films

Spectroscopic ellipsometry investigation of amorphous carbon films

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Source URL: www.manfred.maitz-online.de

Language: English - Date: 2006-01-08 12:30:01
    21 Graduate Creative Activities and Research Forum April 5th, 2016 Southern Illinois University Carbondale

    1 Graduate Creative Activities and Research Forum April 5th, 2016 Southern Illinois University Carbondale

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    Source URL: curca.siu.edu

    Language: English - Date: 2016-07-30 02:56:51
    32007 Annual Report nasdaq | rtec DE A R FE L LOW SH A R EHOL DER S The past year was a challenging one, as semiconductor device manufacturers over-estimated demand, particularly for

    2007 Annual Report nasdaq | rtec DE A R FE L LOW SH A R EHOL DER S The past year was a challenging one, as semiconductor device manufacturers over-estimated demand, particularly for

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    Source URL: www.tamartechnology.com

    Language: English - Date: 2012-05-14 11:44:47
    4 UNITED STATES SECURITIES AND EXCHANGE COMMISSION WASHINGTON, D.C_____________________________ FORM 10-K

    UNITED STATES SECURITIES AND EXCHANGE COMMISSION WASHINGTON, D.C_____________________________ FORM 10-K

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    Source URL: www.tamartechnology.com

    Language: English - Date: 2015-04-28 13:04:29
    5PHYSICAL REVIEW A 70, Quantum ellipsometry using correlated-photon beams Kimani C. Toussaint, Jr.,1 Giovanni Di Giuseppe,1 Kenneth J. Bycenski,1 Alexander V. Sergienko,1,2,* Bahaa E. A. Saleh,1 and Malvin

    PHYSICAL REVIEW A 70, Quantum ellipsometry using correlated-photon beams Kimani C. Toussaint, Jr.,1 Giovanni Di Giuseppe,1 Kenneth J. Bycenski,1 Alexander V. Sergienko,1,2,* Bahaa E. A. Saleh,1 and Malvin

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    Source URL: people.bu.edu

    Language: English - Date: 2004-08-09 18:00:16
      6Labnote - Reflectometry Measurements on a STADI MP

      Labnote - Reflectometry Measurements on a STADI MP

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      Source URL: www.stoe.com

      Language: English - Date: 2014-06-02 13:52:20
      7Project Title: Project Short description High numerical aperture (NA) spectroscopic imaging ellipsometry: Optical Modelling The Applied Nano-Optics laboratory at the INL deploys one of the world’s

      Project Title: Project Short description High numerical aperture (NA) spectroscopic imaging ellipsometry: Optical Modelling The Applied Nano-Optics laboratory at the INL deploys one of the world’s

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      Source URL: inl.int

      Language: English - Date: 2014-09-12 11:21:33
        8MATEC Web of Conferences 4, DOI:   matecconf  C Owned by the authors, published by EDP Sciences, 2013

        MATEC Web of Conferences 4, DOI:   matecconf  C Owned by the authors, published by EDP Sciences, 2013

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        Source URL: cea-proceedings.edpsciences.org

        Language: English
        9Optical Monitoring of Thin-films Using Spectroscopic Ellipsometry Dale E. Morton, Denton Vacuum, LLC, Moorestown, NJ Blaine Johs and Jeff Hale, J.A. Woollam Co., Inc., Lincoln, NE. Key Words: in-situ monitoring

        Optical Monitoring of Thin-films Using Spectroscopic Ellipsometry Dale E. Morton, Denton Vacuum, LLC, Moorestown, NJ Blaine Johs and Jeff Hale, J.A. Woollam Co., Inc., Lincoln, NE. Key Words: in-situ monitoring

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        Source URL: dentonvacuum.com

        Language: English - Date: 2013-04-08 22:29:24
          10Master Thesis Project: Metrology for the manufacturing of thin films Have you ever seen a real hologram? Do you know how to make one? Do you want to build a new set up and measure on various sample to get a 3D rendering

          Master Thesis Project: Metrology for the manufacturing of thin films Have you ever seen a real hologram? Do you know how to make one? Do you want to build a new set up and measure on various sample to get a 3D rendering

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          Source URL: www.tnw.tudelft.nl

          Language: English - Date: 2012-04-02 06:06:20