Electron diffraction

Results: 480



#Item
1Synthesis and neutron diffraction of iron-based high-T c superconductor 154 SmFeAsO 1−x D x Soshi Iimura, Hideo Hosono:Tokyo Tech Electron-doped SmFeAsO shows the highest critical temperature (T c ) among all iron-ba

Synthesis and neutron diffraction of iron-based high-T c superconductor 154 SmFeAsO 1−x D x Soshi Iimura, Hideo Hosono:Tokyo Tech Electron-doped SmFeAsO shows the highest critical temperature (T c ) among all iron-ba

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Source URL: elements-strategy.jp

Language: English - Date: 2018-02-01 00:01:11
    2Supporting Information Alden et alpnasDark-Field Transmission Electron Microscopy and Composite Order-Parameter Vector Images from [−2110] Diffraction Spots As stated in the main text, if an apert

    Supporting Information Alden et alpnasDark-Field Transmission Electron Microscopy and Composite Order-Parameter Vector Images from [−2110] Diffraction Spots As stated in the main text, if an apert

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    Source URL: park.chem.cornell.edu

    Language: English - Date: 2014-09-27 18:35:58
    3Inorganic Crystal Structure Database ICSD  Scientific Manual

    Inorganic Crystal Structure Database ICSD Scientific Manual

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    Source URL: www2.fiz-karlsruhe.de

    Language: English - Date: 2008-11-26 05:26:55
    4Letter pubs.acs.org/NanoLett Twinning and Twisting of Tri- and Bilayer Graphene Lola Brown,†,∥ Robert Hovden,‡,∥ Pinshane Huang,‡ Michal Wojcik,† David A. Muller,‡,§ and Jiwoong Park*,†,§

    Letter pubs.acs.org/NanoLett Twinning and Twisting of Tri- and Bilayer Graphene Lola Brown,†,∥ Robert Hovden,‡,∥ Pinshane Huang,‡ Michal Wojcik,† David A. Muller,‡,§ and Jiwoong Park*,†,§

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    Source URL: park.chem.cornell.edu

    Language: English - Date: 2016-04-26 11:31:29
    5Structure and tunnel magnetoresistance in Fe/MgF2/Co junctions With an oxide seed layer on an Fe bottom electrode S. Mitani,a) T.Moriyama, and K.Takanashi Institute for Mterials Research, Tohoku University, Sendai

    Structure and tunnel magnetoresistance in Fe/MgF2/Co junctions With an oxide seed layer on an Fe bottom electrode S. Mitani,a) T.Moriyama, and K.Takanashi Institute for Mterials Research, Tohoku University, Sendai

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    Source URL: www.1974eiko.co.jp

    Language: English - Date: 2009-05-08 06:42:44
    6Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University

    Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University

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    Source URL: jur.phy.uic.edu

    Language: English - Date: 2012-05-25 16:52:49
    7Using the Scanning Electron Microscope for Discovery Based Learning in Undergraduate Courses Rachel J Beane Department of Geology, Bowdoin College, 6800 College Station, Brunswick, ME 04011,

    Using the Scanning Electron Microscope for Discovery Based Learning in Undergraduate Courses Rachel J Beane Department of Geology, Bowdoin College, 6800 College Station, Brunswick, ME 04011,

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    Source URL: www.bowdoin.edu

    Language: English - Date: 2016-06-30 14:55:30
    8ENHANCE- MC-ITN European Research Training Network of New Materials: Innovative Concepts for their Fabrication, Integration and Characterization Workshop-2:

    ENHANCE- MC-ITN European Research Training Network of New Materials: Innovative Concepts for their Fabrication, Integration and Characterization Workshop-2:

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    Source URL: www.enhance-itn.eu

    Language: English - Date: 2011-03-09 15:05:32
    9Crystallography and Diffraction Schoolorganized by the CrisDi Interdepartmental Centre The school is aimed at PhD students and graduates without registration fees. The language will be English or Italian on reque

    Crystallography and Diffraction Schoolorganized by the CrisDi Interdepartmental Centre The school is aimed at PhD students and graduates without registration fees. The language will be English or Italian on reque

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    Source URL: www.crisdi.unito.it

    Language: English - Date: 2014-06-09 04:45:47
    10Electron microscopy / Scientific method / Microscopes / Science / Chemistry / Microscopy / Scanning electron microscope / Electron microscope / Environmental scanning electron microscope / Electron backscatter diffraction / In situ electron microscopy / Raman microscope

    FEI Quanta 200 SEM - Scanning Electron Microscope Key Benefits Seamless "point and click" transition between imaging modes Superior low vacuum, low kV imaging Simultaneous secondary electron (SE) and back-scattered el

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    Source URL: icob.sinica.edu.tw

    Language: English - Date: 2013-10-08 22:45:00