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Electromigration
Results: 49

#	Item
31	Formation of Highly Reliable Cu/Low-k Interconnects by Using CVD Co Barrier in Dual Damascene Structures Hye Kyung Jung, Hyun-Bae Lee, Matsuda Tsukasa, Eunji Jung, Jong-Ho Yun, Jong Myeong Lee, Gil-Heyun Choi, Siyoung Ch Add to Reading List Source URL: www.appliedmaterials.com Language: English - Date: 2014-05-12 14:31:02 Semiconductor device fabrication Electromigration Electronic design automation Copper interconnect Titanium nitride Thin film Flux Materials science Electronic engineering Chemistry
32	Department of Electrical & Computer Engineering PhD Candidacy Examination 2013 Nanoelectronics 3 hours maximum Page 1 of 2 Add to Reading List Source URL: umanitoba.ca Language: English - Date: 2014-09-12 13:55:19 Emerging technologies Quantum electronics Nanomaterials Quantum dot Electron Electromigration X10 Scanning tunneling microscope Tantalum Physics Condensed matter physics Technology
33	CALIFORNIA STATE SCIENCE FAIR 2013 PROJECT SUMMARY Name(s) Jamie R. Lesser Add to Reading List Source URL: www.usc.edu Language: English - Date: 2013-04-13 17:39:18 Electronic design automation Surface chemistry Science Electromigration Kinetic Monte Carlo Monte Carlo method Adatoms Migration Statistical mechanics Physics Probability and statistics
34	JOURNAL OF APPLIED PHYSICS VOLUME 87, NUMBER 9 1 MAY 2000 Add to Reading List Source URL: math.nist.gov Language: English - Date: 2005-08-09 13:42:04 Microscopes Electron microscopy Electromigration Electronic design automation Image processing Transmission electron microscopy Pixel Single-photon emission computed tomography Projection Medicine Scientific method Science
35	White Paper Understand and Avoid Electromigration (EM) & IR-drop in Custom IP Blocks November 2011 Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 14:37:36 Physics Electromigration Power network design Integrated circuit design Current density Reliability Physical design EM Current crowding Electronic engineering Electronic design automation Electromagnetism
36	BESCHWERDEKAMMERN DES EUROPÄISCHEN PATENTAMTS BOARDS OF APPEAL OF THE EUROPEAN PATENT Add to Reading List Source URL: www.epo.org Language: English - Date: 2011-06-14 11:50:50 Civil law Appeal procedure before the European Patent Office Grant procedure before the European Patent Office Appeal Copper Inventive step and non-obviousness Unity of invention European Patent Convention Electromigration European Patent Organisation Law Patent law
37	Hierarchical Thermal and Electromigration Analysis for Cell-based Designs Srini Krishnamoorthy, Vishak Venkatraman, Thomas Burd, James Pistole, Yuri Apanovich, Rajit Chandra Advanced Micro Devices, One AMD Place, Sunnyv Add to Reading List Source URL: www.gradient-da.com Language: English* - Date: 2012-07-18 18:42:06 Design Semiconductors Failure Heat transfer Electronics manufacturing Reliability Electromigration R-value Measuring instrument Electronic engineering Electronic design automation Technology
38	Microsoft Word - SwitchingConstraintDrivenThermalAndReliabilityAnalysis Add to Reading List Source URL: www.gradient-da.com Language: English - Date: 2011-03-16 16:56:33 Electronic design Semiconductor devices Integrated circuits Resistor Electromigration Integrated circuit design MOSFET Reliability Current source Electronic engineering Electromagnetism Electrical engineering
39	Improving Copper Electromigration Resistance Raymond N. Virtis, Air Products and Chemical, Inc., Allentown PA. Add to Reading List Source URL: www.mri.psu.edu Language: English - Date: 2010-08-25 15:48:58 Chemical elements Transition metals Thin film deposition Dietary minerals Chemical vapor deposition Electromigration Cobalt Titanium nitride Copper Chemistry Matter Semiconductor device fabrication
40	"Failure-Assessment Software For Circuit-Card Assemblies", M. Osterman, and T. Stadterman. Proc. for the Annual Reliability and Maintainability Symposium, pp[removed], Jan 1999. Add to Reading List Source URL: www.calce.umd.edu Language: English - Date: 2007-09-07 15:11:53 Materials science Design Maintenance Electronic design Survival analysis Physics of failure Reliability Failure causes Electromigration Systems engineering Reliability engineering Failure

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