Diffraction

Results: 2669



#Item
51Experimental Problem Determination of energy band gap of semiconductor thin films I. Introduction Semiconductors can be roughly characterized as materials whose electronic properties fall somewhere between those of condu

Experimental Problem Determination of energy band gap of semiconductor thin films I. Introduction Semiconductors can be roughly characterized as materials whose electronic properties fall somewhere between those of condu

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Source URL: www.ipho.org

Language: English - Date: 2009-10-29 21:21:41
52DANSE: Engineering Diffraction Ersan Üstündag Iowa State University

DANSE: Engineering Diffraction Ersan Üstündag Iowa State University

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Source URL: www.cacr.caltech.edu

Language: English - Date: 2006-08-15 16:49:05
53Fischerscope_Nr12_International_Engl_V1_Druck.indd

Fischerscope_Nr12_International_Engl_V1_Druck.indd

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Source URL: www.hftlab.com

Language: English - Date: 2015-10-19 04:46:01
54Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University

Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University

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Source URL: jur.phy.uic.edu

Language: English - Date: 2012-05-25 16:52:49
55 	
  	
  	
  	
  	
  	
  	
  	
    	
     On	
  August	
  21,	
  2017,	
  a	
  total	
  solar	
  eclipse	
  will	
  cross	
  the	
  United	
  States	
  in	
  a	
  path	
  from	
   northwest

                      On  August  21,  2017,  a  total  solar  eclipse  will  cross  the  United  States  in  a  path  from   northwest

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Source URL: eclipse.siu.edu

Language: English - Date: 2016-08-18 14:42:58
56Using the Scanning Electron Microscope for Discovery Based Learning in Undergraduate Courses Rachel J Beane Department of Geology, Bowdoin College, 6800 College Station, Brunswick, ME 04011,

Using the Scanning Electron Microscope for Discovery Based Learning in Undergraduate Courses Rachel J Beane Department of Geology, Bowdoin College, 6800 College Station, Brunswick, ME 04011,

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Source URL: www.bowdoin.edu

Language: English - Date: 2016-06-30 14:55:30
57APS/123-QED  Polarizability measurements in a molecule near-field interferometer Martin Berninger, Andr´e Stefanov, Sarayut Deachapunya, and Markus Arndt∗ Fakult¨ at f¨

APS/123-QED Polarizability measurements in a molecule near-field interferometer Martin Berninger, Andr´e Stefanov, Sarayut Deachapunya, and Markus Arndt∗ Fakult¨ at f¨

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Source URL: arxiv.org

Language: English - Date: 2008-02-08 23:10:49
58X-RAY DIFFRACTION RESIDUAL STRESS MEASUREMENT AND SHOT PEENING QUANTITATIVE CHARACTERIZATION OF PEENING PROCESSES USING X-RAY DIFFRACTION RESIDUAL STRESS ANALYSIS The residual stresses present in manufactured components,

X-RAY DIFFRACTION RESIDUAL STRESS MEASUREMENT AND SHOT PEENING QUANTITATIVE CHARACTERIZATION OF PEENING PROCESSES USING X-RAY DIFFRACTION RESIDUAL STRESS ANALYSIS The residual stresses present in manufactured components,

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Source URL: www.protoxrd.com

Language: English - Date: 2014-12-02 14:05:08
59The Zürich School of Crystallography Bring Your Own Crystals University of Zürich June, 2015 The sixth Zürich School of Crystallography was held within the Department of Chemistry at the University of Zürich (

The Zürich School of Crystallography Bring Your Own Crystals University of Zürich June, 2015 The sixth Zürich School of Crystallography was held within the Department of Chemistry at the University of Zürich (

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Source URL: www.chem.uzh.ch

Language: English - Date: 2016-01-14 10:58:55
60ENHANCE- MC-ITN European Research Training Network of New Materials: Innovative Concepts for their Fabrication, Integration and Characterization Workshop-2:

ENHANCE- MC-ITN European Research Training Network of New Materials: Innovative Concepts for their Fabrication, Integration and Characterization Workshop-2:

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Source URL: www.enhance-itn.eu

Language: English - Date: 2011-03-09 15:05:32