Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University - Diffraction - Document - PDFSEARCH.IO

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$Electron / Chemistry / Physics / Electron microscopy / Microscopy / Electron beam / Diffraction / Microscopes / Transmission electron microscopy / Multislice / Annular dark-field imaging / Electron diffraction$	Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University Add to Reading List Document Date: 2012-05-25 16:52:49 Open Document File Size: 1,04 MB Share Result on Facebook

Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University Add to Reading List