Cryogenic particle detectors

Results: 17



#Item
1Michael Tinkham 1928–2010 A Biographical Memoir by John Clarke, Isaac F. Silvera, and Malcolm R. Beasley

Michael Tinkham 1928–2010 A Biographical Memoir by John Clarke, Isaac F. Silvera, and Malcolm R. Beasley

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Source URL: www.nasonline.org

Language: English - Date: 2015-12-14 11:53:53
2Superconducting niobium nanowire single photon detectors A. J. Annunziata,a A. Frydman,a,c M. O. Reese,a L. Frunzio,a M. Rooks,b D. E. Probera aDepartment of Applied Physics, Yale University, 15 Prospect St. New Haven, C

Superconducting niobium nanowire single photon detectors A. J. Annunziata,a A. Frydman,a,c M. O. Reese,a L. Frunzio,a M. Rooks,b D. E. Probera aDepartment of Applied Physics, Yale University, 15 Prospect St. New Haven, C

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Source URL: www.yale.edu

Language: English - Date: 2007-01-26 11:36:24
3Performance of graphene thermal photon detectors Christopher B. McKitterick, Daniel E. Prober, and Boris S. Karasik Citation: J. Appl. Phys. 113, [removed]); doi: [removed] View online: http://dx.doi.org/10.10

Performance of graphene thermal photon detectors Christopher B. McKitterick, Daniel E. Prober, and Boris S. Karasik Citation: J. Appl. Phys. 113, [removed]); doi: [removed] View online: http://dx.doi.org/10.10

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Source URL: www.yale.edu

Language: English - Date: 2013-01-29 18:22:48
4Energy-resolved detection of single infrared photons with λ=8μm using a superconducting microbolometer Boris S. Karasik, Sergey V. Pereverzev, Alexander Soibel, Daniel F. Santavicca, Daniel E. Prober et al. Citation: A

Energy-resolved detection of single infrared photons with λ=8μm using a superconducting microbolometer Boris S. Karasik, Sergey V. Pereverzev, Alexander Soibel, Daniel F. Santavicca, Daniel E. Prober et al. Citation: A

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Source URL: www.yale.edu

Language: English - Date: 2012-08-01 17:16:42
52943  Photon-Counting Superconducting Detectors for Submillimeter Astronomy L. Frunzio, J. Teufel, M. Shen, D. E. Prober, R. J. Schoelkopf Departments of Applied Physics & Physics, Yale University, New Haven,

2943 Photon-Counting Superconducting Detectors for Submillimeter Astronomy L. Frunzio, J. Teufel, M. Shen, D. E. Prober, R. J. Schoelkopf Departments of Applied Physics & Physics, Yale University, New Haven,

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Source URL: www.yale.edu

Language: English - Date: 2005-02-22 15:31:15
6Mathematical description of relationship between thickness, temperature, and resistivity could spur advances

Mathematical description of relationship between thickness, temperature, and resistivity could spur advances

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Source URL: phys.org

Language: English - Date: 2015-04-16 23:30:46
7NEWS & VIEWS and protective shell. The nanoscale and hydrophobic structures of the network enable the otherwise water-absorbing cotton to repel water nearly as efficiently as the lotus leaf. Furthermore, the treated fabr

NEWS & VIEWS and protective shell. The nanoscale and hydrophobic structures of the network enable the otherwise water-absorbing cotton to repel water nearly as efficiently as the lotus leaf. Furthermore, the treated fabr

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Source URL: www.yale.edu

Language: English - Date: 2008-08-09 13:48:03
8  Presented	
  at	
  the	
  SPIE	
  Symposium	
  on	
  Astronomical	
  Telescopes	
  and	
  Instrumentation	
  2010,	
  27	
  June	
  -­‐	
  2	
  July	
  2010	
   Town	
  and	
  Country	
  Resort

  Presented  at  the  SPIE  Symposium  on  Astronomical  Telescopes  and  Instrumentation  2010,  27  June  -­‐  2  July  2010   Town  and  Country  Resort

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Source URL: www.yale.edu

Language: English - Date: 2010-07-08 16:50:39
9IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, VOL. 19, NO. 3, JUNE[removed]Niobium Superconducting Nanowire Single-Photon Detectors

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, VOL. 19, NO. 3, JUNE[removed]Niobium Superconducting Nanowire Single-Photon Detectors

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Source URL: www.yale.edu

Language: English - Date: 2009-07-17 18:50:02
102014 R&D 100 Awards  S&TR October/November 2014 A Super, Cool Device for Material Characterization

2014 R&D 100 Awards S&TR October/November 2014 A Super, Cool Device for Material Characterization

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Source URL: str.llnl.gov

Language: English - Date: 2014-10-07 09:38:03