![Thin film / Metrology / Measurement / Ellipsometry Thin film / Metrology / Measurement / Ellipsometry](https://www.pdfsearch.io/img/0f0632f10a1c22f9c8b988f48b9cbb30.jpg)
| Document Date: 2012-04-02 06:06:20 Open Document File Size: 895,12 KBShare Result on Facebook
Company Optics Research Group / / Country Netherlands / / / Facility National Metrology Institute / / IndustryTerm solar cell technology / measurement technology / manufacturing / / Organization Research and Development Department of VSL / VSL VSL in Delft / European Union / National Metrology Institute in Netherlands / / Person Omar Gawhary / Omar El Gawhary / / / Technology solar cell technology / measurement technology / /
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