diffraction

Results: 2669



#Item
51Optics / Optical devices / Physics / Diffraction / Photoresistor / Sensors / Electromagnetism / Spectroscopy / Diffraction grating

Experimental Problem Determination of energy band gap of semiconductor thin films I. Introduction Semiconductors can be roughly characterized as materials whose electronic properties fall somewhere between those of condu

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Source URL: www.ipho.org

Language: English - Date: 2009-10-29 21:21:41
52Constitutive equation / Elasticity / Abaqus / Formal languages

DANSE: Engineering Diffraction Ersan Üstündag Iowa State University

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Source URL: www.cacr.caltech.edu

Language: English - Date: 2006-08-15 16:49:05
53Chemistry / Scientific method / Learning / Diffraction / Spectroscopy / X-ray fluorescence / X-ray crystallography / Microscopy / Measuring instrument

Fischerscope_Nr12_International_Engl_V1_Druck.indd

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Source URL: www.hftlab.com

Language: English - Date: 2015-10-19 04:46:01
54Electron / Chemistry / Physics / Electron microscopy / Microscopy / Electron beam / Diffraction / Microscopes / Transmission electron microscopy / Multislice / Annular dark-field imaging / Electron diffraction

Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University

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Source URL: jur.phy.uic.edu

Language: English - Date: 2012-05-25 16:52:49
55Electromagnetic radiation / Astrology / Nature / Eclipses / Diffraction / Optical filter / Ultraviolet / Sun / Solar eclipse / Diffraction grating

                      On  August  21,  2017,  a  total  solar  eclipse  will  cross  the  United  States  in  a  path  from   northwest

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Source URL: eclipse.siu.edu

Language: English - Date: 2016-08-18 14:42:58
56Learning / Scientific method / Microscopes / Chemistry / Electron microscopy / X-rays / Diffraction / Spectroscopy / Scanning electron microscope / Electron backscatter diffraction / Electron microscope / Electron microprobe

Using the Scanning Electron Microscope for Discovery Based Learning in Undergraduate Courses Rachel J Beane Department of Geology, Bowdoin College, 6800 College Station, Brunswick, ME 04011,

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Source URL: www.bowdoin.edu

Language: English - Date: 2016-06-30 14:55:30
57Physics / Chemical physics / Optics / Diffraction / Materials science / Photonics / Polarizability / Polarization / Interferometry / Molecular beam / Dielectric

APS/123-QED Polarizability measurements in a molecule near-field interferometer Martin Berninger, Andr´e Stefanov, Sarayut Deachapunya, and Markus Arndt∗ Fakult¨ at f¨

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Source URL: arxiv.org

Language: English - Date: 2008-02-08 23:10:49
58Shot peening / Metalworking / Materials science / Business / Manufacturing / Corrosion / Mechanical engineering / Fracture mechanics / Laser peening / Peening / Residual stress / Almen strip

X-RAY DIFFRACTION RESIDUAL STRESS MEASUREMENT AND SHOT PEENING QUANTITATIVE CHARACTERIZATION OF PEENING PROCESSES USING X-RAY DIFFRACTION RESIDUAL STRESS ANALYSIS The residual stresses present in manufactured components,

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Source URL: www.protoxrd.com

Language: English - Date: 2014-12-02 14:05:08
59Chemistry / Crystallography / Nature / Condensed matter physics / Materials science / Diffraction / Protein structure / Zrich / X-ray crystallography / Crystal

The Zürich School of Crystallography Bring Your Own Crystals University of Zürich June, 2015 The sixth Zürich School of Crystallography was held within the Department of Chemistry at the University of Zürich (

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Source URL: www.chem.uzh.ch

Language: English - Date: 2016-01-14 10:58:55
60Diffraction / Physics / Chemistry / Crystallography / Materials science / Nature / Particle physics / Electron beam / Low-energy electron diffraction / Electron diffraction / X-ray scattering techniques / X-ray crystallography

ENHANCE- MC-ITN European Research Training Network of New Materials: Innovative Concepts for their Fabrication, Integration and Characterization Workshop-2:

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Source URL: www.enhance-itn.eu

Language: English - Date: 2011-03-09 15:05:32
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