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Chemistry / Raman spectroscopy / Near-field scanning optical microscope / Atomic force microscopy / Microscopy / Vibrational analysis with scanning probe microscopy / Raman scattering / Raman microscope / Nanophotonics / Scanning probe microscopy / Science / Scientific method


Atomic force and shear force based tip-enhanced Raman spectroscopy and imaging
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Document Date: 2012-07-13 02:47:38

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File Size: 1,66 MB

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Shanghai / Berlin / Moscow / Kazan / Essen / London / New York / /

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Carbon Nanotechnology Inc. / Sonic / Maier S A / Merck / IOP Publishing Ltd / NT-MDT Co. / SWCNTs / Olympus / Imperial College Press / /

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Russia / Netherlands / China / /

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Eindhoven University of Technology / Russia University of Duisburg-Essen / Donghua University / Mews A / The Netherlands Kazan State University / /

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metal / chemical / oil / imaging / energy / /

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African Union / Russia University of Duisburg-Essen / The Netherlands Kazan State University / Eindhoven University of Technology / /

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Nano / J. Raman Spectrosc / Souza Filho / Kremlevskaya / /

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Hunter / producer / /

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radiation / laser / optical fibre / dielectric / spectroscopy / /

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