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Standard Test Data Format
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1	FOR IMMEDIATE RELEASE Press Release Credence Standardizes on Galaxy Semiconductor Solutions for Test Data Analysis on ASL Series WALTHAM, MA., December 1, [removed]Galaxy Semiconductor Solutions, a leading provider Add to Reading List Source URL: www.galaxysemi.com Language: English - Date: 2013-02-07 09:00:19 Computer hardware Standard Test Data Format Semiconductor Equipment and Materials International Hewlett-Packard Samsung Galaxy S Computing Technology Credence Systems
2	For Immediate Release Verigy Selects Galaxy Examinator™ for Test Data Analysis WALTHAM, Mass, - May 12, [removed]Galaxy Semiconductor Solutions, a leading provider of test data analysis software, today announced that V Add to Reading List Source URL: www.galaxysemi.com Language: English - Date: 2013-02-07 09:00:25 Agilent Technologies Semiconductor Equipment and Materials International Electronics Verigy Technology Standard Test Data Format
3	October XX, 2010 No[removed]Shin-Marunouchi Center Building[removed]Marunouchi, Chiyoda-ku,Tokyo[removed] Add to Reading List Source URL: www.galaxysemi.com Language: English - Date: 2013-02-07 09:00:23 Automatic test equipment Manufacturing Standard Test Data Format Semiconductor Equipment and Materials International Marunouchi Electronics Verigy Advantest Technology Electronic test equipment
4	PRESS RELEASE FOR IMMEDIATE RELEASE CONTACT: Mark Gallenberger LTX Corporation Add to Reading List Source URL: www.galaxysemi.com Language: English - Date: 2013-02-07 09:00:32 Verigy LTX-Credence LTX Standard Test Data Format Technology
5	GAL-012 Examinator DS.indd Add to Reading List Source URL: www.galaxysemi.com Language: English - Date: 2013-05-16 02:51:17 Standard Test Data Format Data analysis Test data Science Semiconductor device fabrication Software testing Wafer testing
6	DRPC Standard Transfer Formats File Format D – Test Day Data Record BYTE POSITION NUMBER Add to Reading List Source URL: www.quality-certification.com Language: English - Date: 2012-04-21 07:47:09 Computer programming Ch Software engineering Computing
7	Execution Generated Test Cases: How to Make Systems Code Crash Itself Cristian Cadar and Dawson Engler∗ Computer Systems Laboratory Stanford University Stanford, CA 94305, U.S.A. Add to Reading List Source URL: hci.stanford.edu Language: English - Date: 2005-06-09 19:14:00 Data types Procedural programming languages C Standard Library Type theory Abstract interpretation Symbolic execution Printf format string C ALGOL 68 Computing Software engineering Computer programming
8	PDF Document Add to Reading List Source URL: etidweb.tamu.edu Language: English - Date: 1999-07-22 09:39:28 Teradyne Extensible Storage Engine Data management Data type Database Data Graphics file formats Computer file formats Computing Standard Test Data Format
9	PDF Document Add to Reading List Source URL: casey.marshall.googlepages.com Language: English Teradyne Extensible Storage Engine Data management Data type Database Data Graphics file formats Computer file formats Computing Standard Test Data Format

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