<--- Back to Details
| First Page | Document Content | |
|---|---|---|
 Date: 2013-10-17 07:17:58Chemistry Atomic force microscopy AFM probe Cantilever Microscopy Near-field scanning optical microscope Scanning tunneling microscope Characterization Microscope Scanning probe microscopy Science Scientific method |
| NANOSCOPY Scanning Probe Microscopes for extreme Environments Tuning Fork based AFM Measurements of uncapped, stacked InAs Quantum Dots in a GaAs matrix.DocID: 1suBd - View Document |
| NANOSCOPY Scanning Probe Microscopes for extreme Environments AFM / STM imaging at 300 mK and 9 TeslaDocID: 1soUz - View Document |
| W NE www.ntmdt.com NTEGRA Spectra II – automated AFM-Raman, SNOMDocID: 1rgzb - View Document |
| AFM Pulse tube on 295 K see line scanDocID: 1qJik - View Document |
| Application Note 088 full High-Resolution Imaging in Different Atomic Force Microscopy Modes • An operation of AFM microscope in a temperature-stable cabinet facilitates high-resolution studies and makes molecular-scDocID: 1mPBu - View Document |