Datasheet TetraMAX ATPG Automatic Test Pattern Generation Overview

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Date: 2015-02-18 14:15:52 Integrated circuits Automatic test pattern generation Electronics manufacturing Electronic design Test compression Scan chain Iddq testing Joint Test Action Group Synopsys Electronic engineering Electronics Electronic design automation		Datasheet TetraMAX ATPG Automatic Test Pattern Generation Overview Add to Reading List Source URL: www.synopsys.com Download Document from Source Website File Size: 1,07 MB Share Document on Facebook

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