1 Table PIDS1 Near-Term[removed]

First Page		Document Content
Date: 2014-03-30 20:29:47 Computer hardware MOSFET Flash memory High-k dielectric Dynamic random-access memory CMOS Soft error Reliability engineering Threshold voltage Computer memory Electronics Electronic engineering		1 Table PIDS1 Near-Term[removed] Add to Reading List Source URL: public.itrs.net Download Document from Source Website File Size: 52,86 KB Share Document on Facebook

	Hydrogen in high-k dielectric oxides modelled by muonium Rui Vilao - Univ. Coimbra Following the seminal work of Cox et al. (J. Phys. Cond. Matt) on high-k dielectric oxide muonics, we discuss the electro DocID: 1o3zp - View Document
	F R A U N H O F E R I N S T I T U T e for I nte g rate d S y ste m s an d De v i c e T e c hno l o g y I I S B 1 DocID: 19zCS - View Document
	PDF Document DocID: 1954S - View Document
	Photon Factory Activity Report 2005 #23Part BSurface and Interface 4C,6A,15C/2004G059 Residual Order in the Interfacial SiO2 Layer DocID: 18WsR - View Document
	Photon Factory Activity Report 2009 #27 Part BSurface and Interface 18A/2008G186 Effect of oxygen coadsorption on titanium silicide formation on Si(001) DocID: 18UZ5 - View Document