Probe

Results: 3095



#Item
581Atmospheric sciences / Facility for Airborne Atmospheric Measurements / Met Office / Sideslip angle / Turbulence / Aerodynamics / Meteorology / Aerospace engineering

Turbulence Probe Upgrade on an Atmospheric Research Aircraft Freya I. Lumb Who is FAAM? FAAM stands for Facility for Airborne Atmospheric Turbulence which is a collaboration of the Met Office and

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Source URL: www.sepnet.ac.uk

Language: English - Date: 2015-01-23 07:13:15
582Electron microscopy / Microscopes / Microscopy / Magnetic force microscope / Focused ion beam / Electron microscope / Scanning electron microscope / Optical microscope / Atomic force microscopy / Scientific method / Science / Scanning probe microscopy

Types
of
Microscopy
 Type
 Probe
 Technique


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Source URL: teachers.stanford.edu

Language: English - Date: 2009-07-29 14:10:48
583Terrestrial planets / Space science / Venus / Observational astronomy / Mercury / Space probe / Solar System / Moon / Mariner 10 / Planetary science / Astronomy / Space

EXPLORING THE SOLAR SYSTEM Ian Ridpath WE live on a planet called Earth, one of eight major planets orbiting a fairly average star called the Sun. The difference between a star and a planet is that a star is a hot body t

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Source URL: www.ianridpath.com

Language: English - Date: 2014-03-13 18:35:25
584Electromagnetic radiation / Radiometry / Astrophysics / Physical quantities / Bidirectional reflectance distribution function / Bidirectional scattering distribution function / Rendering / Radiance / Light-emitting diode / Optics / Physics / 3D computer graphics

A Planar Light Probe Neil G. Alldrin David J. Kriegman

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Source URL: vision.ucsd.edu

Language: English - Date: 2006-10-06 18:02:50
585Space plasmas / Measuring instruments / Planetary science / Magnetic reconnection / Plasma / Magnetosphere / Langmuir probe / Electric current / Electron / Physics / Plasma physics / Astrophysics

week ending 24 MAY 2013 PHYSICAL REVIEW LETTERS PRL 110, )

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Source URL: w3.pppl.gov

Language: English - Date: 2013-05-24 15:30:46
586Magnetohydrodynamics / Plasma / Current sheet / Lundquist number / Langmuir probe / Magnetic field / Physics / Plasma physics / Magnetic reconnection

VOLUME 88, NUMBER 1 PHYSICAL REVIEW LETTERS 7 JANUARY 2002

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Source URL: mrx.pppl.gov

Language: English - Date: 2002-06-14 17:24:48
587Microscopes / Microbiology / Intermolecular forces / Atomic force microscopy / Scanning tunneling microscope / Optical microscope / Scanning probe microscopy / Scientific method / Science

Nanoscale Images • All the images in these slides were created using scanning tunneling microscopes (STMs) or atomic force microscopes (AFMs). • These images are computer generated from measurements of electric cur

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Source URL: teachers.stanford.edu

Language: English - Date: 2009-07-29 14:10:46
588Bethesda /  Maryland / Cancer research / Nursing research / Lyme disease / Centers for Disease Control and Prevention / Government Accountability Office / Medicine / Health / National Institutes of Health

from Leslie Feinberg August 2011 transgenderwarrior.org my research notes on the medical politics driving the “Lyme Wars” Part 4: U.S. gov’t probe: ‘potential conflicts of interest’ In November 2000, media repo

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Source URL: www.transgenderwarrior.org

Language: English - Date: 2011-08-25 17:57:22
589Microscopy / Atomic force microscopy / Microscope / Scanning tunneling microscope / Magnetic force microscope / Nanotechnology / Optical microscope / Electron microscope / Gerd Binnig / Science / Scanning probe microscopy / Scientific method

Scanning Probe Microscopy What are scanning probe microscopes? Scanning probe microscopes (SPMs) are a family of tools used to make images of nanoscale surfaces and structures, including atoms. They use a physical prob

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Source URL: teachers.stanford.edu

Language: English - Date: 2009-07-29 14:10:35
590Intermolecular forces / Chemistry / Atomic force microscopy / Image scanner / Park Systems / Piezoelectricity / X-ray computed tomography / Scanning electron microscope / Scientific method / Science / Scanning probe microscopy

Surface Topography Considerations of Patterned Sapphire Substrates for Blue/Green light Emitting Diode General Considerations Nitride-based semiconductor materials (i.e., GaN, InGaN, AlN) have attracted considerable atte

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Source URL: www.nanowerk.com

Language: English - Date: 2011-11-12 18:00:00
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