P-6: Static Reliability of Bridged-Grain Poly-Si TFTs

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Date: 2014-10-10 03:11:49 Semiconductors Molecular electronics Organic electronics Display technology Semiconductor device fabrication Thin-film transistor Negative bias temperature instability Hot carrier injection AMOLED Electronics Electromagnetism Technology		P-6: Static Reliability of Bridged-Grain Poly-Si TFTs Add to Reading List Source URL: www.pskl.ust.hk Download Document from Source Website File Size: 3,21 MB Share Document on Facebook

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