ARTICLES Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications MO LI, H. X. TANG* AND M. L. ROUKES†

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Date: 2007-11-04 15:44:18 Electromagnetism Electrical engineering Scanning probe microscopy Sensors Electrical phenomena Atomic-force microscopy Electronic design Magnetic resonance force microscopy Piezoresistive effect Nanoelectromechanical systems JohnsonNyquist noise Mechanical resonance		ARTICLES Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications MO LI, H. X. TANG* AND M. L. ROUKES† Add to Reading List Source URL: nano.caltech.edu Download Document from Source Website File Size: 584,82 KB Share Document on Facebook

	ARTICLES Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications MO LI, H. X. TANG* AND M. L. ROUKES† DocID: 1qEWS - View Document
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