NanoWorld

Results: 47



#Item
21Chemistry / Intermolecular forces / Atomic force microscopy / Laboratory techniques / Nanotechnology / Microscopy / NanoWorld / Cantilever / Nanosurf / Science / Scientific method / Scanning probe microscopy

Nanosurf NaniteAFM Mountable AFM for Industrial Applications Main Features: • Mountable • Compact

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Source URL: www.nanowerk.com

Language: English - Date: 2012-03-25 18:00:00
22Biology / Spectroscopy / Condensed matter physics / Nanotechnology / Canton of Neuchâtel / Atomic force microscopy / NanoWorld / Force spectroscopy / Scanning tunneling microscope / Science / Scanning probe microscopy / Chemistry

5-6 October 2011 in Berlin 10th International Symposium on Scanning Probe Microscopy & Optical Tweezers in Life Sciences A forum for applications in scanning probe and optical tweezers technologies

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Source URL: www.nanobioviews.net

Language: English - Date: 2011-09-28 12:35:18
23Scanning probe microscopy / Liestal / Nanosurf / Canton of Neuchâtel / Neuchâtel / NanoWorld / Microscopes / Atomic force microscopy / Scanning tunneling microscope / Science / Technology / Nanotechnology

Nanosurf ® AG Nano Made Simple Nanosurf is a leading provider of easy-to-use atomic force and scanning tunneling microscopes. Nanosurf was founded 1997 with a clear vision in mind: to design scanning probe microscopes t

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Source URL: www.nanowerk.com

Language: English - Date: 2009-03-30 18:00:00
24Microscopes / Chemistry / Scanning tunneling microscope / Intermolecular forces / Atomic force microscopy / Microscopy / Canton of Neuchâtel / Conductive atomic force microscopy / NanoWorld / Scanning probe microscopy / Science / Scientific method

Microsoft PowerPoint - ENGS-AFM [Compatibility Mode]

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Source URL: nanofab.caltech.edu

Language: English - Date: 2013-01-21 22:21:44
25Chemistry / Intermolecular forces / Atomic force microscopy / Park Systems / Microscopy / Image scanner / Vibrational analysis with scanning probe microscopy / NanoWorld / Science / Scientific method / Scanning probe microscopy

Critical Dimensions Measurement of High Aspect Ratio Trench with XE AFM >>> Figure 1. (a) XE Scan System separates the Z-scanner from

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Source URL: www.nanowerk.com

Language: English - Date: 2011-11-12 18:00:00
26Building engineering / Materials science / Carbon nanotube / Zinc oxide / NanoWorld / Doping / Chemistry / Emerging technologies / Ultraviolet radiation

Prof. Jim Chelikowsky Tex Moncrief Chair of Computational Materials

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Source URL: www.che.utexas.edu

Language: English - Date: 2015-03-26 12:04:42
27Scanning probe microscopy / Nanotechnology / Micelle / Supramolecular chemistry / Cetrimonium bromide / Surfactant / AFM probe / Atomic force microscopy / NanoWorld / Chemistry / Science / Colloidal chemistry

Surfactant micelles in aqueous solution: critical resolution in AFM It’s a widely spread idea that performing AFM in liquids is a rather complicated research approach. Actually, many tasks related to the investigation

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Source URL: www.ntmdt.com

Language: English - Date: 2009-08-18 06:09:11
28Chemistry / Atomic force microscopy / Microscopy / Near-field scanning optical microscope / Nanotechnology / Nanosensors / NanoWorld / Scanning probe microscopy / Science / Scientific method

HybriD™ Mode Atomic Force Microscopy (AFM) from NT-MDT - An Interview with Sergei Magonov HybriD™ Mode Atomic Force Microscopy (AFM) from NT-MDT - An Interview with Sergei Magonov Interview by Will Soutter

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Source URL: www.ntmdt.ru

Language: English - Date: 2013-08-08 00:48:22
29Chemistry / Atomic force microscopy / Microscopy / Near-field scanning optical microscope / Nanotechnology / Nanosensors / NanoWorld / Scanning probe microscopy / Science / Scientific method

HybriD™ Mode Atomic Force Microscopy (AFM) from NT-MDT - An Interview with Sergei Magonov HybriD™ Mode Atomic Force Microscopy (AFM) from NT-MDT - An Interview with Sergei Magonov Interview by Will Soutter

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Source URL: www.ntmdt.com

Language: English - Date: 2013-08-08 00:48:22
30Nanotechnology / Emerging technologies / Canton of Neuchâtel / Neuchâtel / Scanning probe microscopy / NanoWorld / Cantilever / Atomic force microscopy / Mineral processing / Technology / Science / Chemistry

PFPC Visitors Professor Stanley I Sandler Henry B du Pont Chair, Department of Chemical Engineering, University of Delaware Delaware, USA

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Source URL: www.pfpc.unimelb.edu.au

Language: English - Date: 2013-01-21 19:42:12
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