Model-Test-Model

Results: 1541



#Item
541Psychometrics / Educational psychology / Estimation theory / Measurement / Statistical models / Rasch model / Score / Test / Confidence interval / Statistics / Education / Knowledge

Microsoft Word - 2010_MOD_Math_Tech Report_Final Edits_.doc

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Source URL: marylandpublicschools.org

Language: English - Date: 2013-08-22 16:22:52
542Statistical models / Statistical classification / Model selection / Overfitting / Bayesian network / Cross-validation / Support vector machine / Graphical model / Naive Bayes classifier / Statistics / Bayesian statistics / Machine learning

Learning on the Test Data: Leveraging “Unseen” Features Ben Taskar BTASKAR @ CS . STANFORD . EDU Ming Fai Wong MINGFAI . WONG @ CS . STANFORD . EDU

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Source URL: ai.stanford.edu

Language: English - Date: 2005-10-04 19:13:52
543Software testing / Extreme programming / Smalltalk / Acceptance testing / Test-driven development / VisualWorks / Actor model / SUnit / Seaside / Software engineering / Computing / Computer programming

CS18 and ESUG 20, Ghent, August 25th - 31st, [removed]CS18 and ESUG 20, Ghent, August 25th - 31st, 2012 This document contains my report of the ESUG conference in Ghent, August 27th - 31st, 2012 (and the Camp Smalltalk du

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Source URL: www.esug.org

Language: English - Date: 2013-07-01 09:34:19
544Econometrics / Multivariate statistics / Statistical methods / Analysis of covariance / Two-way analysis of variance / General linear model / SAS / Dummy variable / F-test / Statistics / Regression analysis / Analysis of variance

HRP 262 SAS LAB FIVE, April 28, 2010 Lab Five: ANOVA, ANCOVA, and linear regression in SAS Lab Objectives After today’s lab you should be able to:

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Source URL: web.stanford.edu

Language: English - Date: 2010-04-28 10:30:18
545Electrical engineering / Electronics / Transistor / IC power supply pin / Akaike information criterion / Electronic design / Single-stage transistor amplifiers / Electronic engineering / Integrated circuits / Bipolar junction transistor

IEEE BCTM 4.2 Study of bipolar transistor matching at high current level with various test configurations leading to a new model approach Samuel Bordez1, Stephane Danaie1, Regis Difrenza1, Jean-Charles Vildeuil1, Gerard

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Source URL: ece.wpi.edu

Language: English - Date: 2008-02-25 14:54:18
546Evaluation / Rasch model / Normal distribution / Test / Reliability / Intelligence quotient / Grade / Level of measurement / Education / Psychometrics / Statistics

9. SUMMARY OF OPERATIONAL TEST RESULTS FOR THE 2011 MOD-MSA: MATHEMATICS This section presents both the raw score and scaled score summaries for the Mod-MSA: Mathematics by grade. Table[removed]presents the raw score summa

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Source URL: www.marylandpublicschools.org

Language: English - Date: 2013-08-22 16:23:02
547Cross-platform software / Variables / Procedural programming languages / ADMB / Free statistical software / Constructor / Test / Pascal / C / Software engineering / Computing / Mathematics

Specification of R functions to generate dat and pin files for the PBSadmb R project The objective of these functions is to generate dat and pin files used with AD Model Builder (ADMB) directly from R. This will facilita

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Source URL: www.admb-project.org

Language: English - Date: 2013-07-25 17:57:37
548Global Innovation Index / Research / Latitude of the Gulf Stream and the Gulf Stream north wall index

6. IRT ITEM LEVEL STATISTICS FOR THE 2011 MOD-MSA: MATHEMATICS 6.1 Rationale for the Use of the Rasch Model In addition to reporting raw score summary statistics and item level statistics using classical test theory (CTT

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Source URL: www.marylandpublicschools.org

Language: English - Date: 2013-08-22 16:23:01
549Statistics / Item response theory / Guttman scale / Scale / Reliability / WorkKeys / Test / Rasch model / Attribute Hierarchy Method / Psychometrics / Education / Evaluation

A Study of Modified-Guttman and IRT-Based Level Scoring Procedures for Work Keys Assessments

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Source URL: act.org

Language: English - Date: 2015-01-06 13:08:29
550Electrical equipment in hazardous areas / ATEX directive / HTC Dream / G1 / Intrinsic safety / Proof test / Electrical engineering / Electrical safety / Electromagnetism

! Contact our sales office for delivery dates and prices as this is a special model. SP134X-015X P: RX

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Source URL: www.smcworld.com

Language: English - Date: 2013-10-24 21:34:17
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