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Microstructure
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191	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-19 10:55:19 Mechanical engineering Electrical engineering Microelectromechanical systems Microtechnology Transducers Coating Nanoparticle Nanotechnology Materials science Technology Science
192	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-19 10:56:18 Semiconductor device fabrication Electron microscopy Materials science Failure Failure analysis Reliability engineering Reliability Electron microscope Microelectromechanical systems Science Technology Electromagnetism
193	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:27:23 Nanoparticle Electron microscope Environmental scanning electron microscope Nanotechnology Electron microscopy Science Scanning electron microscope
194	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-19 10:54:40 Electron microscopy Failure Failure analysis Maintenance Problem solving Reliability engineering Wafer bonding Electron microscope Microscopy Scientific method Science Chemistry
195	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:28:18 Electron microscopy Mass spectrometry Molecular electronics Conductive polymers Electron microscope Scanning electron microscope OLED Characterization Inductively coupled plasma mass spectrometry Scientific method Science Chemistry
196	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:28:47 Materials science Semiconductors Electronics manufacturing Failure Electronic design Reliability Wafer bonding Wire bonding Microelectromechanical systems Technology Microtechnology Semiconductor device fabrication
197 $Semiconductor device fabrication / Thin film deposition / Electron beam / Focused ion beam / Failure analysis / Electron beam induced current / Electron microscope / Scanning electron microscope / Electron backscatter diffraction / Scientific method / Science / Electron microscopy$	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:29:23 Semiconductor device fabrication Thin film deposition Electron beam Focused ion beam Failure analysis Electron beam induced current Electron microscope Scanning electron microscope Electron backscatter diffraction Scientific method Science Electron microscopy
198	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:27:47 Dielectrics Ceramic materials Glass Ceramic Microelectromechanical systems Materials science Electromagnetism Chemistry
199	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-19 10:55:49 Electromagnetism Electrical engineering Mechanical engineering Microelectromechanical systems Transducers Microsystem Technologies Wafer bonding Shuvo Roy RF MEMS Materials science Microtechnology Technology
200	Chapter 1 An introduction to magmas and magmatic rocks ogist may study a suite of igneous rocks with one or more objectives in mind, including: Add to Reading List Source URL: media.wiley.com Language: English - Date: 2013-08-22 10:16:50 Igneous rock Volcanic rock Rock microstructure Basalt Geochemistry Fractional crystallization Magma Aphanite Andesite Petrology Geology Igneous petrology

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