Volume 39, Number 20 Focus on Microscopy Faster, Smaller, More Economical Imaging Tools at SPIE 2007: The Effect of Nanotech by Barbara Foster

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Nanotechnology Platform　Seminar 2013 2nd TEM School TEM school will be held on Tuesday, November 19 in Research Center for Ultra High Voltage Electron Microscopy (UHVEM), Osaka University. The following classes will be

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CCEM Summer School on Electron Microscopy a 5-day course for users with experience in electron microscopy, on the fundamentals of aberration corrected imaging, electron energy loss spectroscopy, electron tomography, ult

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• Chemistry
• Diffraction
• Crystallography
• Physics
• Zeolites
• Materials science
• Electron microscopy
• ZSM-5
• X-ray crystallography
• Texture
• Nanocomposite
• Electron diffraction

In-situ microscopy and spectroscopy techniques for electrochemical processes A T WO DAYS WORKSHOP jointly organised by the NSERC APC networks CaRPE-FC and LIB to discuss advanced in-situ characterization techniques with

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• Electron microscopy
• Biology
• Scientific method
• Learning
• Pathology
• Microscopes
• Microscopy
• Cell biology
• Electron microscope
• Cryo-electron microscopy
• Transmission electron microscopy
• Scanning electron microscope

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